%0 Journal Article %1 journals/mr/LambertLCKTTBCMLM12 %A Lambert, Benoit %A Labat, Nathalie %A Carisetti, Dominique %A Karboyan, Serge %A Tartarin, Jean-Guy %A Thorpe, Jim %A Brunel, Laurent %A Curutchet, Arnaud %A Malbert, Nathalie %A Latu-Romain, Eddy %A Mermoux, Michel %D 2012 %J Microelectron. Reliab. %K dblp %N 9-10 %P 2184-2187 %T Evidence of relationship between mechanical stress and leakage current in AlGaN/GaN transistor after storage test. %U http://dblp.uni-trier.de/db/journals/mr/mr52.html#LambertLCKTTBCMLM12 %V 52

@article{journals/mr/LambertLCKTTBCMLM12, added-at = {2022-02-04T00:00:00.000+0100}, author = {Lambert, Benoit and Labat, Nathalie and Carisetti, Dominique and Karboyan, Serge and Tartarin, Jean-Guy and Thorpe, Jim and Brunel, Laurent and Curutchet, Arnaud and Malbert, Nathalie and Latu-Romain, Eddy and Mermoux, Michel}, biburl = {https://www.bibsonomy.org/bibtex/245170c4dad762faf5d404e0c59e4b505/dblp}, ee = {https://doi.org/10.1016/j.microrel.2012.06.100}, interhash = {bfb8b60fbca5164bfe78531f90321f0f}, intrahash = {45170c4dad762faf5d404e0c59e4b505}, journal = {Microelectron. Reliab.}, keywords = {dblp}, number = {9-10}, pages = {2184-2187}, timestamp = {2024-04-09T02:48:30.000+0200}, title = {Evidence of relationship between mechanical stress and leakage current in AlGaN/GaN transistor after storage test.}, url = {http://dblp.uni-trier.de/db/journals/mr/mr52.html#LambertLCKTTBCMLM12}, volume = 52, year = 2012 }