%0 Journal Article %1 journals/mr/DuongBCSLPFP05 %A Duong, Q.-H. %A Buchaillot, Lionel %A Collard, Dominique %A Schmitt, Petra %A Lafontan, Xavier %A Pons, Patrick %A Flourens, F. %A Pressecq, Francis %D 2005 %J Microelectron. Reliab. %K dblp %N 9-11 %P 1790-1793 %T Thermal and electrostatic reliability characterization in RF MEMS switches. %U http://dblp.uni-trier.de/db/journals/mr/mr45.html#DuongBCSLPFP05 %V 45

@article{journals/mr/DuongBCSLPFP05, added-at = {2021-10-14T00:00:00.000+0200}, author = {Duong, Q.-H. and Buchaillot, Lionel and Collard, Dominique and Schmitt, Petra and Lafontan, Xavier and Pons, Patrick and Flourens, F. and Pressecq, Francis}, biburl = {https://www.bibsonomy.org/bibtex/2adc34163530ea46775d1d74f7ad9a583/dblp}, ee = {https://doi.org/10.1016/j.microrel.2005.07.095}, interhash = {c15f1ec1901ee0de3d3b0e652604b94e}, intrahash = {adc34163530ea46775d1d74f7ad9a583}, journal = {Microelectron. Reliab.}, keywords = {dblp}, number = {9-11}, pages = {1790-1793}, timestamp = {2024-04-09T02:50:36.000+0200}, title = {Thermal and electrostatic reliability characterization in RF MEMS switches.}, url = {http://dblp.uni-trier.de/db/journals/mr/mr45.html#DuongBCSLPFP05}, volume = 45, year = 2005 }