%0 Journal Article %1 journals/mr/DammannBPBKQMGS17 %A Dammann, Maximilian %A Baeumler, Martina %A Polyakov, Vladimir %A Brückner, Peter %A Konstanzer, Helmer %A Quay, Rüdiger %A Mikulla, Michael %A Graff, Andreas %A Simon-Najasek, Michél %D 2017 %J Microelectron. Reliab. %K dblp %P 292-297 %T Reliability of 100 nm AlGaN/GaN HEMTs for mm-wave applications. %U http://dblp.uni-trier.de/db/journals/mr/mr76.html#DammannBPBKQMGS17 %V 76-77

@article{journals/mr/DammannBPBKQMGS17, added-at = {2021-10-14T00:00:00.000+0200}, author = {Dammann, Maximilian and Baeumler, Martina and Polyakov, Vladimir and Brückner, Peter and Konstanzer, Helmer and Quay, Rüdiger and Mikulla, Michael and Graff, Andreas and Simon-Najasek, Michél}, biburl = {https://www.bibsonomy.org/bibtex/252dab303d3492d6933088b6b0fb5f224/dblp}, ee = {https://doi.org/10.1016/j.microrel.2017.07.008}, interhash = {c296282b1e43f194dd3516647ccf8a30}, intrahash = {52dab303d3492d6933088b6b0fb5f224}, journal = {Microelectron. Reliab.}, keywords = {dblp}, pages = {292-297}, timestamp = {2024-04-09T02:48:30.000+0200}, title = {Reliability of 100 nm AlGaN/GaN HEMTs for mm-wave applications.}, url = {http://dblp.uni-trier.de/db/journals/mr/mr76.html#DammannBPBKQMGS17}, volume = {76-77}, year = 2017 }