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%0 Conference Paper
%1 conf/vlsi-dat/LinderCKW13
%A Linder, Barry P.
%A Cartier, Eduard
%A Krishnan, S.
%A Wu, Ernest Y.
%B VLSI-DAT
%D 2013
%I IEEE
%K dblp
%P 1-4
%T Improving and optimizing reliability in future technologies with high-κ dielectrics.
%U http://dblp.uni-trier.de/db/conf/vlsi-dat/vlsi-dat2013.html#LinderCKW13
%@ 978-1-4673-4435-7
@inproceedings{conf/vlsi-dat/LinderCKW13,
added-at = {2019-05-31T00:00:00.000+0200},
author = {Linder, Barry P. and Cartier, Eduard and Krishnan, S. and Wu, Ernest Y.},
biburl = {https://www.bibsonomy.org/bibtex/2348612b02137380d7d0b832faf29896f/dblp},
booktitle = {VLSI-DAT},
crossref = {conf/vlsi-dat/2013},
ee = {https://doi.org/10.1109/VLDI-DAT.2013.6533828},
interhash = {c534198c9f68cd64cdc601bbaed7034b},
intrahash = {348612b02137380d7d0b832faf29896f},
isbn = {978-1-4673-4435-7},
keywords = {dblp},
pages = {1-4},
publisher = {IEEE},
timestamp = {2019-06-01T11:50:53.000+0200},
title = {Improving and optimizing reliability in future technologies with high-κ dielectrics.},
url = {http://dblp.uni-trier.de/db/conf/vlsi-dat/vlsi-dat2013.html#LinderCKW13},
year = 2013
}