%0 Conference Paper %1 conf/ddecs/MukhopadhyayCR07 %A Mukhopadhyay, Saibal %A Chen, Qikai %A Roy, Kaushik %B DDECS %D 2007 %E Girard, Patrick %E Krasniewski, Andrzej %E Gramatová, Elena %E Pawlak, Adam %E Garbolino, Tomasz %I IEEE Computer Society %K dblp %P 69-74 %T Memories in Scaled Technologies: A Review of Process Induced Failures, Test Methodologies, and Fault Tolerance. %U http://dblp.uni-trier.de/db/conf/ddecs/ddecs2007.html#MukhopadhyayCR07 %@ 1-4244-1161-0

@inproceedings{conf/ddecs/MukhopadhyayCR07, added-at = {2023-03-24T00:00:00.000+0100}, author = {Mukhopadhyay, Saibal and Chen, Qikai and Roy, Kaushik}, biburl = {https://www.bibsonomy.org/bibtex/2373b8331eea189b9647a80eebfd8fdc8/dblp}, booktitle = {DDECS}, crossref = {conf/ddecs/2007}, editor = {Girard, Patrick and Krasniewski, Andrzej and Gramatová, Elena and Pawlak, Adam and Garbolino, Tomasz}, ee = {https://doi.ieeecomputersociety.org/10.1109/DDECS.2007.4295256}, interhash = {c99fcd6a4551ebf44f403432546bab01}, intrahash = {373b8331eea189b9647a80eebfd8fdc8}, isbn = {1-4244-1161-0}, keywords = {dblp}, pages = {69-74}, publisher = {IEEE Computer Society}, timestamp = {2024-04-10T06:40:49.000+0200}, title = {Memories in Scaled Technologies: A Review of Process Induced Failures, Test Methodologies, and Fault Tolerance.}, url = {http://dblp.uni-trier.de/db/conf/ddecs/ddecs2007.html#MukhopadhyayCR07}, year = 2007 }