%0 Journal Article %1 journals/tvlsi/BinLCLHC16 %A Bin, Shu-Yung %A Lin, Shih-Feng %A Cheng, Ya Ching %A Liau, Wen-Rong %A Hou, Alex %A Chao, Mango C.-T. %D 2016 %J IEEE Trans. Very Large Scale Integr. Syst. %K dblp %N 2 %P 625-637 %T Predicting Shot-Level SRAM Read/Write Margin Based on Measured Transistor Characteristics. %U http://dblp.uni-trier.de/db/journals/tvlsi/tvlsi24.html#BinLCLHC16 %V 24

@article{journals/tvlsi/BinLCLHC16, added-at = {2020-03-11T00:00:00.000+0100}, author = {Bin, Shu-Yung and Lin, Shih-Feng and Cheng, Ya Ching and Liau, Wen-Rong and Hou, Alex and Chao, Mango C.-T.}, biburl = {https://www.bibsonomy.org/bibtex/2b2553f8e88a3276e6277bde4fffe83ab/dblp}, ee = {https://doi.org/10.1109/TVLSI.2015.2418998}, interhash = {cafe29bd2c62ccb8f2af1e8778f112e0}, intrahash = {b2553f8e88a3276e6277bde4fffe83ab}, journal = {IEEE Trans. Very Large Scale Integr. Syst.}, keywords = {dblp}, number = 2, pages = {625-637}, timestamp = {2020-03-12T11:41:44.000+0100}, title = {Predicting Shot-Level SRAM Read/Write Margin Based on Measured Transistor Characteristics.}, url = {http://dblp.uni-trier.de/db/journals/tvlsi/tvlsi24.html#BinLCLHC16}, volume = 24, year = 2016 }