%0 Conference Paper %1 conf/essderc/MontiRBGGBPCTVW14 %A Monti, F. %A Reggiani, Susanna %A Barone, Gaetano %A Gnani, Elena %A Gnudi, Antonio %A Baccarani, Giorgio %A Poli, Stefano %A Chuang, Ming-Yeh %A Tian, Weidong %A Varghese, D. %A Wise, Rick %B ESSDERC %D 2014 %I IEEE %K dblp %P 333-336 %T TCAD analysis of HCS degradation in LDMOS devices under AC stress conditions. %U http://dblp.uni-trier.de/db/conf/essderc/essderc2014.html#MontiRBGGBPCTVW14 %@ 978-1-4799-4378-4

@inproceedings{conf/essderc/MontiRBGGBPCTVW14, added-at = {2022-11-02T00:00:00.000+0100}, author = {Monti, F. and Reggiani, Susanna and Barone, Gaetano and Gnani, Elena and Gnudi, Antonio and Baccarani, Giorgio and Poli, Stefano and Chuang, Ming-Yeh and Tian, Weidong and Varghese, D. and Wise, Rick}, biburl = {https://www.bibsonomy.org/bibtex/24f423aec89a2763f782caaa377db3896/dblp}, booktitle = {ESSDERC}, crossref = {conf/essderc/2014}, ee = {https://www.wikidata.org/entity/Q60583977}, interhash = {cba071265ec94de0a29b2e096f9a5b8b}, intrahash = {4f423aec89a2763f782caaa377db3896}, isbn = {978-1-4799-4378-4}, keywords = {dblp}, pages = {333-336}, publisher = {IEEE}, timestamp = {2024-04-10T10:01:46.000+0200}, title = {TCAD analysis of HCS degradation in LDMOS devices under AC stress conditions.}, url = {http://dblp.uni-trier.de/db/conf/essderc/essderc2014.html#MontiRBGGBPCTVW14}, year = 2014 }