%0 Conference Paper %1 conf/prdc/SaysanasongkhamNAF12 %A Saysanasongkham, Aromhack %A Negishi, Masahiko %A Arai, Masayuki %A Fukumoto, Satoshi %B PRDC %D 2012 %I IEEE Computer Society %K dblp %P 127-134 %T A Dependable Processor by Using Built-in Self Test to Tolerate Periodical Transient Faults under Highly Electromagnetic Environment. %U http://dblp.uni-trier.de/db/conf/prdc/prdc2012.html#SaysanasongkhamNAF12 %@ 978-1-4673-4849-2

@inproceedings{conf/prdc/SaysanasongkhamNAF12, added-at = {2023-03-23T00:00:00.000+0100}, author = {Saysanasongkham, Aromhack and Negishi, Masahiko and Arai, Masayuki and Fukumoto, Satoshi}, biburl = {https://www.bibsonomy.org/bibtex/2a60a10b88d6d6433aa1b598ee999b901/dblp}, booktitle = {PRDC}, crossref = {conf/prdc/2012}, ee = {https://doi.ieeecomputersociety.org/10.1109/PRDC.2012.19}, interhash = {cbebc2e6be78628afa2c5d2d5d0f367b}, intrahash = {a60a10b88d6d6433aa1b598ee999b901}, isbn = {978-1-4673-4849-2}, keywords = {dblp}, pages = {127-134}, publisher = {IEEE Computer Society}, timestamp = {2024-04-10T09:24:55.000+0200}, title = {A Dependable Processor by Using Built-in Self Test to Tolerate Periodical Transient Faults under Highly Electromagnetic Environment.}, url = {http://dblp.uni-trier.de/db/conf/prdc/prdc2012.html#SaysanasongkhamNAF12}, year = 2012 }