%0 Journal Article %1 journals/mr/SolknerKSW04 %A Sölkner, Gerald %A Kaindl, Winfried %A Schulze, Hans-Joachim %A Wachutka, Gerhard K. M. %D 2004 %J Microelectron. Reliab. %K dblp %N 9-11 %P 1399-1406 %T Reliability of power electronic devices against cosmic radiation-induced failure. %U http://dblp.uni-trier.de/db/journals/mr/mr44.html#SolknerKSW04 %V 44

@article{journals/mr/SolknerKSW04, added-at = {2020-02-22T00:00:00.000+0100}, author = {Sölkner, Gerald and Kaindl, Winfried and Schulze, Hans-Joachim and Wachutka, Gerhard K. M.}, biburl = {https://www.bibsonomy.org/bibtex/2148ebd0b73bc028ccbf3853212093476/dblp}, ee = {https://doi.org/10.1016/j.microrel.2004.07.024}, interhash = {cd3b621076449b39afb851ac201c827f}, intrahash = {148ebd0b73bc028ccbf3853212093476}, journal = {Microelectron. Reliab.}, keywords = {dblp}, number = {9-11}, pages = {1399-1406}, timestamp = {2020-02-25T13:28:25.000+0100}, title = {Reliability of power electronic devices against cosmic radiation-induced failure.}, url = {http://dblp.uni-trier.de/db/journals/mr/mr44.html#SolknerKSW04}, volume = 44, year = 2004 }