%0 Journal Article %1 journals/mr/ZhangZWD15 %A Zhang, Cunbo %A de Zhang, Jian %A Wang, Honggang %A Du, Guangxing %D 2015 %J Microelectron. Reliab. %K dblp %N 3-4 %P 508-513 %T Burnout properties of microwave pulse injected on GaAs PHEMT. %U http://dblp.uni-trier.de/db/journals/mr/mr55.html#ZhangZWD15 %V 55

@article{journals/mr/ZhangZWD15, added-at = {2020-02-22T00:00:00.000+0100}, author = {Zhang, Cunbo and de Zhang, Jian and Wang, Honggang and Du, Guangxing}, biburl = {https://www.bibsonomy.org/bibtex/25f88932c9fd56d1c13e633df3229eec7/dblp}, ee = {https://doi.org/10.1016/j.microrel.2015.01.003}, interhash = {ce0083acdafa2a3ae4341fdc1785c023}, intrahash = {5f88932c9fd56d1c13e633df3229eec7}, journal = {Microelectron. Reliab.}, keywords = {dblp}, number = {3-4}, pages = {508-513}, timestamp = {2020-02-25T13:22:41.000+0100}, title = {Burnout properties of microwave pulse injected on GaAs PHEMT.}, url = {http://dblp.uni-trier.de/db/journals/mr/mr55.html#ZhangZWD15}, volume = 55, year = 2015 }