Inproceedings,
Automating DRAM Fault Mitigation By Learning From Experience.
E. Baseman, N. DeBardeleben, K. Ferreira, V. Sridharan, T. Siddiqua, and O. Tkachenko.DSN Workshops, page 137-140. IEEE Computer Society, (2017)
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- BibTeX key
- conf/dsn/BasemanDFSST17
- entry type
- inproceedings
- booktitle
- DSN Workshops
- year
- 2017
- pages
- 137-140
- publisher
- IEEE Computer Society
- crossref
- conf/dsn/2017w
- ee
- https://doi.ieeecomputersociety.org/10.1109/DSN-W.2017.39
- isbn
- 978-1-5386-2272-8
- url
- http://dblp.uni-trier.de/db/conf/dsn/dsn2017w.html#BasemanDFSST17
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%1 conf/dsn/BasemanDFSST17
%A Baseman, Elisabeth
%A DeBardeleben, Nathan
%A Ferreira, Kurt B.
%A Sridharan, Vilas
%A Siddiqua, Taniya
%A Tkachenko, Olena
%B DSN Workshops
%D 2017
%I IEEE Computer Society
%K dblp
%P 137-140
%T Automating DRAM Fault Mitigation By Learning From Experience.
%U http://dblp.uni-trier.de/db/conf/dsn/dsn2017w.html#BasemanDFSST17
%@ 978-1-5386-2272-8
@inproceedings{conf/dsn/BasemanDFSST17,
added-at = {2023-03-24T00:00:00.000+0100},
author = {Baseman, Elisabeth and DeBardeleben, Nathan and Ferreira, Kurt B. and Sridharan, Vilas and Siddiqua, Taniya and Tkachenko, Olena},
biburl = {https://www.bibsonomy.org/bibtex/2bbc73cb3ea2bd8dc5870b7552f7f6420/dblp},
booktitle = {DSN Workshops},
crossref = {conf/dsn/2017w},
ee = {https://doi.ieeecomputersociety.org/10.1109/DSN-W.2017.39},
interhash = {ce673f124d6268e6be9facefd94d44e2},
intrahash = {bbc73cb3ea2bd8dc5870b7552f7f6420},
isbn = {978-1-5386-2272-8},
keywords = {dblp},
pages = {137-140},
publisher = {IEEE Computer Society},
timestamp = {2024-04-10T16:41:46.000+0200},
title = {Automating DRAM Fault Mitigation By Learning From Experience.},
url = {http://dblp.uni-trier.de/db/conf/dsn/dsn2017w.html#BasemanDFSST17},
year = 2017
}