%0 Conference Paper %1 conf/asicon/YehLWC11 %A Yeh, Chingwei %A Liu, Yan-Nan %A Wang, Jinn-Shyan %A Chang, Pei-Yao %B ASICON %D 2011 %I IEEE %K dblp %P 248-251 %T Variation-resilient voltage generation for SRAM weak cell testing. %U http://dblp.uni-trier.de/db/conf/asicon/asicon2011.html#YehLWC11 %@ 978-1-61284-192-2

@inproceedings{conf/asicon/YehLWC11, added-at = {2016-06-22T00:00:00.000+0200}, author = {Yeh, Chingwei and Liu, Yan-Nan and Wang, Jinn-Shyan and Chang, Pei-Yao}, biburl = {https://www.bibsonomy.org/bibtex/23d6d2fd46e9f34e716fc1a52c59f56c1/dblp}, booktitle = {ASICON}, crossref = {conf/asicon/2011}, ee = {http://dx.doi.org/10.1109/ASICON.2011.6157168}, interhash = {d1e3316154cc8897e5055417d57b9157}, intrahash = {3d6d2fd46e9f34e716fc1a52c59f56c1}, isbn = {978-1-61284-192-2}, keywords = {dblp}, pages = {248-251}, publisher = {IEEE}, timestamp = {2016-06-23T11:39:00.000+0200}, title = {Variation-resilient voltage generation for SRAM weak cell testing.}, url = {http://dblp.uni-trier.de/db/conf/asicon/asicon2011.html#YehLWC11}, year = 2011 }