%0 Conference Paper %1 conf/itc/MittalKP14 %A Mittal, Rajesh %A Kawoosa, Mudasir %A Parekhji, Rubin A. %B ITC %D 2014 %I IEEE Computer Society %K dblp %P 1-9 %T Systematic approach for trim test time optimization: Case study on a multi-core RF SOC. %U http://dblp.uni-trier.de/db/conf/itc/itc2014.html#MittalKP14 %@ 978-1-4799-4722-5

@inproceedings{conf/itc/MittalKP14, added-at = {2023-03-23T00:00:00.000+0100}, author = {Mittal, Rajesh and Kawoosa, Mudasir and Parekhji, Rubin A.}, biburl = {https://www.bibsonomy.org/bibtex/2518446fadc457db039415ff3b5b3ad41/dblp}, booktitle = {ITC}, crossref = {conf/itc/2014}, ee = {https://doi.ieeecomputersociety.org/10.1109/TEST.2014.7035319}, interhash = {d4f060245cc1fb7fe30333de2f0c826f}, intrahash = {518446fadc457db039415ff3b5b3ad41}, isbn = {978-1-4799-4722-5}, keywords = {dblp}, pages = {1-9}, publisher = {IEEE Computer Society}, timestamp = {2024-04-10T04:29:56.000+0200}, title = {Systematic approach for trim test time optimization: Case study on a multi-core RF SOC.}, url = {http://dblp.uni-trier.de/db/conf/itc/itc2014.html#MittalKP14}, year = 2014 }