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%0 Conference Paper
%1 conf/itc/MittalKP14
%A Mittal, Rajesh
%A Kawoosa, Mudasir
%A Parekhji, Rubin A.
%B ITC
%D 2014
%I IEEE Computer Society
%K dblp
%P 1-9
%T Systematic approach for trim test time optimization: Case study on a multi-core RF SOC.
%U http://dblp.uni-trier.de/db/conf/itc/itc2014.html#MittalKP14
%@ 978-1-4799-4722-5
@inproceedings{conf/itc/MittalKP14,
added-at = {2023-03-23T00:00:00.000+0100},
author = {Mittal, Rajesh and Kawoosa, Mudasir and Parekhji, Rubin A.},
biburl = {https://www.bibsonomy.org/bibtex/2518446fadc457db039415ff3b5b3ad41/dblp},
booktitle = {ITC},
crossref = {conf/itc/2014},
ee = {https://doi.ieeecomputersociety.org/10.1109/TEST.2014.7035319},
interhash = {d4f060245cc1fb7fe30333de2f0c826f},
intrahash = {518446fadc457db039415ff3b5b3ad41},
isbn = {978-1-4799-4722-5},
keywords = {dblp},
pages = {1-9},
publisher = {IEEE Computer Society},
timestamp = {2024-04-10T04:29:56.000+0200},
title = {Systematic approach for trim test time optimization: Case study on a multi-core RF SOC.},
url = {http://dblp.uni-trier.de/db/conf/itc/itc2014.html#MittalKP14},
year = 2014
}