%0 Conference Paper %1 conf/ats/HsiehLLK08 %A Hsieh, Ming-Ting %A Lu, Shun-Yen %A Liou, Jing-Jia %A Kifli, Augusli %B ATS %D 2008 %I IEEE Computer Society %K dblp %P 131-136 %T High Quality Pattern Generation for Delay Defects with Functional Sensitized Paths. %U http://dblp.uni-trier.de/db/conf/ats/ats2008.html#HsiehLLK08 %@ 978-0-7695-3396-4

@inproceedings{conf/ats/HsiehLLK08, added-at = {2023-03-24T00:00:00.000+0100}, author = {Hsieh, Ming-Ting and Lu, Shun-Yen and Liou, Jing-Jia and Kifli, Augusli}, biburl = {https://www.bibsonomy.org/bibtex/2ff9a028129c19666392e18fcef2aab60/dblp}, booktitle = {ATS}, crossref = {conf/ats/2008}, ee = {https://doi.ieeecomputersociety.org/10.1109/ATS.2008.41}, interhash = {d6358847071aea5a3880b6597fa3dff2}, intrahash = {ff9a028129c19666392e18fcef2aab60}, isbn = {978-0-7695-3396-4}, keywords = {dblp}, pages = {131-136}, publisher = {IEEE Computer Society}, timestamp = {2024-04-10T06:37:03.000+0200}, title = {High Quality Pattern Generation for Delay Defects with Functional Sensitized Paths.}, url = {http://dblp.uni-trier.de/db/conf/ats/ats2008.html#HsiehLLK08}, year = 2008 }