%0 Journal Article %1 journals/mr/LeeSC01 %A Lee, Jon C. %A Su, David %A Chuang, J. H. %D 2001 %J Microelectron. Reliab. %K dblp %N 9-10 %P 1551-1556 %T A Novel Application of the FIB Lift-out Technique for 3-D TEM Analysis. %U http://dblp.uni-trier.de/db/journals/mr/mr41.html#LeeSC01 %V 41

@article{journals/mr/LeeSC01, added-at = {2020-02-22T00:00:00.000+0100}, author = {Lee, Jon C. and Su, David and Chuang, J. H.}, biburl = {https://www.bibsonomy.org/bibtex/234d5a72f55483bfed30573dc14830f17/dblp}, ee = {https://doi.org/10.1016/S0026-2714(01)00174-3}, interhash = {d65b6c6a6f48d70295fe465300d17672}, intrahash = {34d5a72f55483bfed30573dc14830f17}, journal = {Microelectron. Reliab.}, keywords = {dblp}, number = {9-10}, pages = {1551-1556}, timestamp = {2020-02-25T13:23:10.000+0100}, title = {A Novel Application of the FIB Lift-out Technique for 3-D TEM Analysis.}, url = {http://dblp.uni-trier.de/db/journals/mr/mr41.html#LeeSC01}, volume = 41, year = 2001 }