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%0 Journal Article
%1 journals/mr/Garcia-SanchezO15
%A García-Sánchez, Francisco J.
%A Ortiz-Conde, Adelmo
%A Muci, Juan
%A Sucre-González, Andrea
%A Liou, Juin J.
%D 2015
%J Microelectron. Reliab.
%K dblp
%N 2
%P 293-307
%T A unified look at the use of successive differentiation and integration in MOSFET model parameter extraction.
%U http://dblp.uni-trier.de/db/journals/mr/mr55.html#Garcia-SanchezO15
%V 55
@article{journals/mr/Garcia-SanchezO15,
added-at = {2020-02-22T00:00:00.000+0100},
author = {García-Sánchez, Francisco J. and Ortiz-Conde, Adelmo and Muci, Juan and Sucre-González, Andrea and Liou, Juin J.},
biburl = {https://www.bibsonomy.org/bibtex/29f182f14382fd3cfe8d31d916c71e0c6/dblp},
ee = {https://doi.org/10.1016/j.microrel.2014.11.013},
interhash = {d6f99ce9710204d7264fff312b081917},
intrahash = {9f182f14382fd3cfe8d31d916c71e0c6},
journal = {Microelectron. Reliab.},
keywords = {dblp},
number = 2,
pages = {293-307},
timestamp = {2020-02-25T13:23:10.000+0100},
title = {A unified look at the use of successive differentiation and integration in MOSFET model parameter extraction.},
url = {http://dblp.uni-trier.de/db/journals/mr/mr55.html#Garcia-SanchezO15},
volume = 55,
year = 2015
}