%0 Conference Paper %1 conf/isese/HirayamaYOMK02 %A Hirayama, Masayuki %A Yamamoto, Tetsuya %A Okayasu, Jiro %A Mizuno, Osamu %A Kikuno, Tohru %B ISESE %D 2002 %I IEEE Computer Society %K dblp %P 183-194 %T Elimination of Crucial Faults by a New Selective Testing Method. %U http://dblp.uni-trier.de/db/conf/isese/isese2002.html#HirayamaYOMK02 %@ 0-7695-1796-X

@inproceedings{conf/isese/HirayamaYOMK02, added-at = {2023-03-23T00:00:00.000+0100}, author = {Hirayama, Masayuki and Yamamoto, Tetsuya and Okayasu, Jiro and Mizuno, Osamu and Kikuno, Tohru}, biburl = {https://www.bibsonomy.org/bibtex/2d1a0fe3a01aad0dcef5fa01f54b9803f/dblp}, booktitle = {ISESE}, crossref = {conf/isese/2002}, ee = {https://doi.ieeecomputersociety.org/10.1109/ISESE.2002.1166937}, interhash = {d99ea7217d0ce8207783765ae4c0740c}, intrahash = {d1a0fe3a01aad0dcef5fa01f54b9803f}, isbn = {0-7695-1796-X}, keywords = {dblp}, pages = {183-194}, publisher = {IEEE Computer Society}, timestamp = {2024-04-10T13:56:21.000+0200}, title = {Elimination of Crucial Faults by a New Selective Testing Method.}, url = {http://dblp.uni-trier.de/db/conf/isese/isese2002.html#HirayamaYOMK02}, year = 2002 }