%0 Conference Paper %1 conf/ats/GuoRP01 %A Guo, Ruifeng %A Reddy, Sudhakar M. %A Pomeranz, Irith %B Asian Test Symposium %D 2001 %I IEEE Computer Society %K dblp %P 82- %T On Improving a Fault Simulation Based Test Generator for Synchronous Sequential Circuits. %U http://dblp.uni-trier.de/db/conf/ats/ats2001.html#GuoRP01 %@ 0-7695-1378-6

@inproceedings{conf/ats/GuoRP01, added-at = {2023-03-24T00:00:00.000+0100}, author = {Guo, Ruifeng and Reddy, Sudhakar M. and Pomeranz, Irith}, biburl = {https://www.bibsonomy.org/bibtex/2d5c1d172b9a8803aa8983a9daecaf0fb/dblp}, booktitle = {Asian Test Symposium}, crossref = {conf/ats/2001}, ee = {https://doi.ieeecomputersociety.org/10.1109/ATS.2001.990264}, interhash = {dd39eef1596e40f7a846b8c7c48ba963}, intrahash = {d5c1d172b9a8803aa8983a9daecaf0fb}, isbn = {0-7695-1378-6}, keywords = {dblp}, pages = {82-}, publisher = {IEEE Computer Society}, timestamp = {2024-04-10T06:35:48.000+0200}, title = {On Improving a Fault Simulation Based Test Generator for Synchronous Sequential Circuits.}, url = {http://dblp.uni-trier.de/db/conf/ats/ats2001.html#GuoRP01}, year = 2001 }