%0 Journal Article %1 journals/chinaf/YuXRLOP16 %A Yu, Bei %A Xu, Xiaoqing %A Roy, Subhendu %A Lin, Yibo %A Ou, Jiaojiao %A Pan, David Z. %D 2016 %J Sci. China Inf. Sci. %K dblp %N 6 %P 061406:1-061406:23 %T Design for manufacturability and reliability in extreme-scaling VLSI. %U http://dblp.uni-trier.de/db/journals/chinaf/chinaf59.html#YuXRLOP16 %V 59

@article{journals/chinaf/YuXRLOP16, added-at = {2020-03-02T00:00:00.000+0100}, author = {Yu, Bei and Xu, Xiaoqing and Roy, Subhendu and Lin, Yibo and Ou, Jiaojiao and Pan, David Z.}, biburl = {https://www.bibsonomy.org/bibtex/2a3130d280b27723560d4cb24d9785c94/dblp}, ee = {https://doi.org/10.1007/s11432-016-5560-6}, interhash = {df9ec4a4c7aed30786cc9b34349f67d6}, intrahash = {a3130d280b27723560d4cb24d9785c94}, journal = {Sci. China Inf. Sci.}, keywords = {dblp}, number = 6, pages = {061406:1-061406:23}, timestamp = {2020-03-03T11:54:35.000+0100}, title = {Design for manufacturability and reliability in extreme-scaling VLSI.}, url = {http://dblp.uni-trier.de/db/journals/chinaf/chinaf59.html#YuXRLOP16}, volume = 59, year = 2016 }