%0 Journal Article %1 journals/mr/SchmittPLDPNOEFC03 %A Schmitt, Petra %A Pressecq, Francis %A Lafontan, Xavier %A Duong, Q.-H. %A Pons, Patrick %A Nicot, Jean Marc %A Oudéa, Coumar %A Estève, Daniel %A Fourniols, Jean-Yves %A Camon, Henri %D 2003 %J Microelectron. Reliab. %K dblp %N 9-11 %P 1957-1962 %T Application of MEMS behavioral simulation to Physics of Failure (PoF) modeling. %U http://dblp.uni-trier.de/db/journals/mr/mr43.html#SchmittPLDPNOEFC03 %V 43

@article{journals/mr/SchmittPLDPNOEFC03, added-at = {2020-10-26T00:00:00.000+0100}, author = {Schmitt, Petra and Pressecq, Francis and Lafontan, Xavier and Duong, Q.-H. and Pons, Patrick and Nicot, Jean Marc and Oudéa, Coumar and Estève, Daniel and Fourniols, Jean-Yves and Camon, Henri}, biburl = {https://www.bibsonomy.org/bibtex/297e85c545f390e37c2bc6b90872e5915/dblp}, ee = {https://doi.org/10.1016/S0026-2714(03)00332-9}, interhash = {e36ba47949927012dd547833b60758e3}, intrahash = {97e85c545f390e37c2bc6b90872e5915}, journal = {Microelectron. Reliab.}, keywords = {dblp}, number = {9-11}, pages = {1957-1962}, timestamp = {2020-10-27T12:44:39.000+0100}, title = {Application of MEMS behavioral simulation to Physics of Failure (PoF) modeling.}, url = {http://dblp.uni-trier.de/db/journals/mr/mr43.html#SchmittPLDPNOEFC03}, volume = 43, year = 2003 }