%0 Journal Article %1 journals/tcas/TakahashiTYFTNSS12 %A Takahashi, Ryo %A Takata, Hidehiro %A Yasufuku, Tadashi %A Fuketa, Hiroshi %A Takamiya, Makoto %A Nomura, Masahiro %A Shinohara, Hirofumi %A Sakurai, Takayasu %D 2012 %J IEEE Trans. Circuits Syst. II Express Briefs %K dblp %N 12 %P 918-921 %T Large Within-Die Gate Delay Variations in Sub-Threshold Logic Circuits at Low Temperature. %U http://dblp.uni-trier.de/db/journals/tcas/tcasII59.html#TakahashiTYFTNSS12 %V 59-II

@article{journals/tcas/TakahashiTYFTNSS12, added-at = {2020-05-27T00:00:00.000+0200}, author = {Takahashi, Ryo and Takata, Hidehiro and Yasufuku, Tadashi and Fuketa, Hiroshi and Takamiya, Makoto and Nomura, Masahiro and Shinohara, Hirofumi and Sakurai, Takayasu}, biburl = {https://www.bibsonomy.org/bibtex/22809ada102feda3decde8703473dddb3/dblp}, ee = {https://doi.org/10.1109/TCSII.2012.2231038}, interhash = {e71cba3bad587d2a1107db03b9448fad}, intrahash = {2809ada102feda3decde8703473dddb3}, journal = {IEEE Trans. Circuits Syst. II Express Briefs}, keywords = {dblp}, number = 12, pages = {918-921}, timestamp = {2020-05-28T11:54:13.000+0200}, title = {Large Within-Die Gate Delay Variations in Sub-Threshold Logic Circuits at Low Temperature.}, url = {http://dblp.uni-trier.de/db/journals/tcas/tcasII59.html#TakahashiTYFTNSS12}, volume = {59-II}, year = 2012 }