%0 Conference Paper %1 conf/delta/DoulcierFR08 %A Doulcier, M. %A Flottes, Marie-Lise %A Rouzeyre, Bruno %B DELTA %D 2008 %I IEEE Computer Society %K dblp %P 314-321 %T AES-Based BIST: Self-Test, Test Pattern Generation and Signature Analysis. %U http://dblp.uni-trier.de/db/conf/delta/delta2008.html#DoulcierFR08 %@ 978-0-7695-3110-6

@inproceedings{conf/delta/DoulcierFR08, added-at = {2023-03-24T00:00:00.000+0100}, author = {Doulcier, M. and Flottes, Marie-Lise and Rouzeyre, Bruno}, biburl = {https://www.bibsonomy.org/bibtex/2a4de386b5ee03ddef5ac02d81238277a/dblp}, booktitle = {DELTA}, crossref = {conf/delta/2008}, ee = {https://doi.ieeecomputersociety.org/10.1109/DELTA.2008.86}, interhash = {e7a7e4063649689dbf2ee10e70b7d0b4}, intrahash = {a4de386b5ee03ddef5ac02d81238277a}, isbn = {978-0-7695-3110-6}, keywords = {dblp}, pages = {314-321}, publisher = {IEEE Computer Society}, timestamp = {2024-04-10T16:15:57.000+0200}, title = {AES-Based BIST: Self-Test, Test Pattern Generation and Signature Analysis.}, url = {http://dblp.uni-trier.de/db/conf/delta/delta2008.html#DoulcierFR08}, year = 2008 }