%0 Conference Paper %1 conf/date/PomeranzR03 %A Pomeranz, Irith %A Reddy, Sudhakar M. %B DATE %D 2003 %I IEEE Computer Society %K dblp %P 11000-11005 %T A New Approach to Test Generation and Test Compaction for Scan Circuits. %U http://dblp.uni-trier.de/db/conf/date/date2003.html#PomeranzR03 %@ 0-7695-1870-2

@inproceedings{conf/date/PomeranzR03, added-at = {2023-03-24T00:00:00.000+0100}, author = {Pomeranz, Irith and Reddy, Sudhakar M.}, biburl = {https://www.bibsonomy.org/bibtex/255188e77dcd8563571e40c02cca0750a/dblp}, booktitle = {DATE}, crossref = {conf/date/2003}, ee = {http://dl.acm.org/citation.cfm?id=1022853}, interhash = {e7c704c1d53167fb307fd49ac1ff30b1}, intrahash = {55188e77dcd8563571e40c02cca0750a}, isbn = {0-7695-1870-2}, keywords = {dblp}, pages = {11000-11005}, publisher = {IEEE Computer Society}, timestamp = {2024-04-10T06:54:02.000+0200}, title = {A New Approach to Test Generation and Test Compaction for Scan Circuits.}, url = {http://dblp.uni-trier.de/db/conf/date/date2003.html#PomeranzR03}, year = 2003 }