%0 Journal Article %1 journals/tcad/PomeranzR03c %A Pomeranz, Irith %A Reddy, Sudhakar M. %D 2003 %J IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. %K dblp %N 12 %P 1663-1670 %T Transparent scan: a new approach to test generation and test compaction for scan circuits that incorporates limited scan operations. %U http://dblp.uni-trier.de/db/journals/tcad/tcad22.html#PomeranzR03c %V 22

@article{journals/tcad/PomeranzR03c, added-at = {2020-09-24T00:00:00.000+0200}, author = {Pomeranz, Irith and Reddy, Sudhakar M.}, biburl = {https://www.bibsonomy.org/bibtex/25e33a23133ac427fe594c2ac31759d74/dblp}, ee = {https://doi.org/10.1109/TCAD.2003.819424}, interhash = {f0be4150aec5ca164131315949e7ba5d}, intrahash = {5e33a23133ac427fe594c2ac31759d74}, journal = {IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.}, keywords = {dblp}, number = 12, pages = {1663-1670}, timestamp = {2020-09-25T11:48:57.000+0200}, title = {Transparent scan: a new approach to test generation and test compaction for scan circuits that incorporates limited scan operations.}, url = {http://dblp.uni-trier.de/db/journals/tcad/tcad22.html#PomeranzR03c}, volume = 22, year = 2003 }