Please log in to take part in the discussion (add own reviews or comments).
Cite this publication
More citation styles
- please select -
%0 Journal Article
%1 journals/technometrics/Pascual03
%A Pascual, Francis G.
%D 2003
%J Technometrics
%K dblp
%N 2
%P 130-141
%T Theory for Optimal Test Plans for the Random Fatigue-Limit Model.
%U http://dblp.uni-trier.de/db/journals/technometrics/technometrics45.html#Pascual03
%V 45
@article{journals/technometrics/Pascual03,
added-at = {2016-08-21T00:00:00.000+0200},
author = {Pascual, Francis G.},
biburl = {https://www.bibsonomy.org/bibtex/2f4464ae6ada306d1c5177b3b3a1b3ef8/dblp},
ee = {http://dx.doi.org/10.1198/004017003188618760},
interhash = {f6f09f9105963ef42d808bed99076b18},
intrahash = {f4464ae6ada306d1c5177b3b3a1b3ef8},
journal = {Technometrics},
keywords = {dblp},
number = 2,
pages = {130-141},
timestamp = {2016-08-23T11:43:27.000+0200},
title = {Theory for Optimal Test Plans for the Random Fatigue-Limit Model.},
url = {http://dblp.uni-trier.de/db/journals/technometrics/technometrics45.html#Pascual03},
volume = 45,
year = 2003
}