%0 Journal Article %1 journals/ieiceee/CaiYWLLW17 %A Cai, Shuo %A Yu, Fei %A Wang, Weizheng %A Liu, Tieqiao %A Liu, Peng %A Wang, Wei %D 2017 %J IEICE Electron. Express %K %N 7 %P 20170128 %T Reliability evaluation of logic circuits based on transient faults propagation metrics. %U http://dblp.uni-trier.de/db/journals/ieiceee/ieiceee14.html#CaiYWLLW17 %V 14

@article{journals/ieiceee/CaiYWLLW17, added-at = {2023-12-14T16:35:48.000+0100}, author = {Cai, Shuo and Yu, Fei and Wang, Weizheng and Liu, Tieqiao and Liu, Peng and Wang, Wei}, biburl = {https://www.bibsonomy.org/bibtex/25594ef4d88e760ec31d7314ac67c5c74/admin}, ee = {https://doi.org/10.1587/elex.14.20170128}, interhash = {fa53dd8efdfbbe9a1dfdcd8c35be778f}, intrahash = {5594ef4d88e760ec31d7314ac67c5c74}, journal = {IEICE Electron. Express}, keywords = {}, number = 7, pages = 20170128, timestamp = {2023-12-14T16:35:48.000+0100}, title = {Reliability evaluation of logic circuits based on transient faults propagation metrics.}, url = {http://dblp.uni-trier.de/db/journals/ieiceee/ieiceee14.html#CaiYWLLW17}, volume = 14, year = 2017 }