%0 Conference Paper %1 conf/vlsid/VenkatramanSA95 %A Venkatraman, Sivaramakrishnan %A Seth, Sharad C. %A Agrawal, Prathima %B VLSI Design %D 1995 %I IEEE Computer Society %K dblp %P 116-120 %T Parallel test generation with low communication overhead. %U http://dblp.uni-trier.de/db/conf/vlsid/vlsid1995.html#VenkatramanSA95 %@ 0-8186-6905-5

@inproceedings{conf/vlsid/VenkatramanSA95, added-at = {2023-03-24T00:00:00.000+0100}, author = {Venkatraman, Sivaramakrishnan and Seth, Sharad C. and Agrawal, Prathima}, biburl = {https://www.bibsonomy.org/bibtex/20656f6cc2d8a2c404ed160c3cff98345/dblp}, booktitle = {VLSI Design}, crossref = {conf/vlsid/1995}, ee = {https://doi.ieeecomputersociety.org/10.1109/ICVD.1995.512088}, interhash = {fa8cc6dd7b1d04d9bc5ae683b5414653}, intrahash = {0656f6cc2d8a2c404ed160c3cff98345}, isbn = {0-8186-6905-5}, keywords = {dblp}, pages = {116-120}, publisher = {IEEE Computer Society}, timestamp = {2024-04-10T05:46:44.000+0200}, title = {Parallel test generation with low communication overhead.}, url = {http://dblp.uni-trier.de/db/conf/vlsid/vlsid1995.html#VenkatramanSA95}, year = 1995 }