%0 Conference Paper %1 conf/ets/TuduLSA09 %A Tudu, Jaynarayan T. %A Larsson, Erik %A Singh, Virendra %A Agrawal, Vishwani D. %B ETS %D 2009 %I IEEE Computer Society %K dblp %P 25-30 %T On Minimization of Peak Power for Scan Circuit during Test. %U http://dblp.uni-trier.de/db/conf/ets/ets2009.html#TuduLSA09 %@ 978-0-7695-3703-0

@inproceedings{conf/ets/TuduLSA09, added-at = {2023-03-23T00:00:00.000+0100}, author = {Tudu, Jaynarayan T. and Larsson, Erik and Singh, Virendra and Agrawal, Vishwani D.}, biburl = {https://www.bibsonomy.org/bibtex/2afa7148acda2a55df2a9f422f1233727/dblp}, booktitle = {ETS}, crossref = {conf/ets/2009}, ee = {https://doi.ieeecomputersociety.org/10.1109/ETS.2009.36}, interhash = {fb9238b18f6a34e6acda292625d7d694}, intrahash = {afa7148acda2a55df2a9f422f1233727}, isbn = {978-0-7695-3703-0}, keywords = {dblp}, pages = {25-30}, publisher = {IEEE Computer Society}, timestamp = {2024-04-10T20:47:13.000+0200}, title = {On Minimization of Peak Power for Scan Circuit during Test.}, url = {http://dblp.uni-trier.de/db/conf/ets/ets2009.html#TuduLSA09}, year = 2009 }