%0 Conference Paper %1 conf/aspdac/JoshiASB10 %A Joshi, Vivek %A Agarwal, Kanak %A Sylvester, Dennis %A Blaauw, David T. %B ASP-DAC %D 2010 %I IEEE %K dblp %P 739-744 %T Analyzing electrical effects of RTA-driven local anneal temperature variation. %U http://dblp.uni-trier.de/db/conf/aspdac/aspdac2010.html#JoshiASB10 %@ 978-1-60558-837-7

@inproceedings{conf/aspdac/JoshiASB10, added-at = {2018-07-31T00:00:00.000+0200}, author = {Joshi, Vivek and Agarwal, Kanak and Sylvester, Dennis and Blaauw, David T.}, biburl = {https://www.bibsonomy.org/bibtex/2e77e44f2f7cd2b8a21d5b29c62a75415/dblp}, booktitle = {ASP-DAC}, crossref = {conf/aspdac/2010}, ee = {http://dl.acm.org/citation.cfm?id=1899892}, interhash = {ffcefa4f029d4132424d38e5f4c0c97e}, intrahash = {e77e44f2f7cd2b8a21d5b29c62a75415}, isbn = {978-1-60558-837-7}, keywords = {dblp}, pages = {739-744}, publisher = {IEEE}, timestamp = {2019-10-17T16:46:10.000+0200}, title = {Analyzing electrical effects of RTA-driven local anneal temperature variation.}, url = {http://dblp.uni-trier.de/db/conf/aspdac/aspdac2010.html#JoshiASB10}, year = 2010 }