BibSonomy publications for /author/Gronthoud

Delay-fault testing and defects in deep sub-micron ICs-does critical resistance really mean anything?

dblp — 2012-02-08T00:00:00+01:00

Will R. Moore, Guido Gronthoud, Keith Baker, and Maurice Lousberg ITC, page 95-104. IEEE Computer Society, (2000)

Power Supply Noise in Delay Testing.

dblp — 2012-02-08T00:00:00+01:00

Jing Wang 0006, D. M. H. Walker, Ananta K. Majhi, Bram Kruseman, Guido Gronthoud, Luis Elvira Villagra, Paul van de Wiel, and Stefan Eichenberger ITC, page 1-10. IEEE, (2006)

A novel stuck-at based method for transistor stuck-open fault diagnosis.

dblp — 2012-02-07T00:00:00+01:00

Xinyue Fan, Will R. Moore, Camelia Hora, and Guido Gronthoud ITC, page 9. IEEE, (2005)

Functional vs. multi-VDD testing of RF circuits.

dblp — 2012-02-07T00:00:00+01:00

Estella Silva, José Pineda de Gyvez, and Guido Gronthoud ITC, page 9. IEEE, (2005)

Memory Testing Under Different Stress Conditions: An Industrial Evaluation

dblp — 2011-12-05T00:00:00+01:00

Ananta K. Majhi, Mohamed Azimane, Guido Gronthoud, Maurice Lousberg, Stefan Eichenberger, and Fred Bowen CoRR (2007)

Analog Test Bus Infrastructure for RF/AMS Modules in Core-Based Design.

dblp — 2011-08-25T00:00:00+02:00

Vladimir A. Zivkovic, Frank van der Heyden, Guido Gronthoud, and Frans de Jong European Test Symposium, page 27-32. IEEE Computer Society, (2008)

Extending gate-level diagnosis tools to CMOS intra-gate faults.

dblp — 2011-06-22T00:00:00+02:00

Xinyue Fan, Will R. Moore, Camelia Hora, and Guido Gronthoud IET Computers & Digital Techniques 1(6):685-693 (2007)

A Gate-Level Method for Transistor-Level Bridging Fault Diagnosis.

dblp — 2011-06-22T00:00:00+02:00

Xinyue Fan, Will R. Moore, Camelia Hora, Mario H. Konijnenburg, and Guido Gronthoud VTS, page 266-271. IEEE Computer Society, (2006)

Algorithms for ADC Multi-site Test with Digital Input Stimulus.

dblp — 2010-08-27T00:00:00+02:00

Xiaoqin Sheng, Hans G. Kerkhoff, Amir Zjajo, and Guido Gronthoud European Test Symposium, page 45-50. IEEE Computer Society, (2009)

Modeling Power Supply Noise in Delay Testing.

dblp — 2009-11-25T00:00:00+01:00

Jing Wang 0006, Duncan M. Hank Walker, Xiang Lu, Ananta K. Majhi, Bram Kruseman, Guido Gronthoud, Luis Elvira Villagra, Paul J. A. M. van de Wiel, and Stefan Eichenberger IEEE Design & Test of Computers 24(3):226-234 (2007)

Multi-VDD Testing for Analog Circuits.

dblp — 2007-09-18T00:00:00+02:00

José Pineda de Gyvez, Guido Gronthoud, and Rashid Amine J. Electronic Testing 21(3):311-322 (2005)

Structural Fault Modeling and Fault Detection Through Neyman-Pearson Decision Criteria for Analog Integrated Circuits.

dblp — 2007-09-18T00:00:00+02:00

Amir Zjajo, José Pineda de Gyvez, and Guido Gronthoud J. Electronic Testing 22(4-6):399-409 (2006)

Re-configuration of sub-blocks for effective application of time domain tests.

dblp — 2007-06-22T00:00:00+02:00

Jens Anders, Shaji Krishnan, and Guido Gronthoud DATE, page 707-712. ACM, (2007)

On Performance Testing with Path Delay Patterns.

dblp — 2007-06-04T00:00:00+02:00

Bram Kruseman, Ananta K. Majhi, and Guido Gronthoud VTS, page 29-34. IEEE Computer Society, (2007)

On Hazard-free Patterns for Fine-delay Fault Testing.

dblp — 2006-09-21T00:00:00+02:00

Bram Kruseman, Ananta K. Majhi, Guido Gronthoud, and Stefan Eichenberger ITC, page 213-222. IEEE, (2004)

Power Supply Ramping for Quasi-static Testing of PLLs.

dblp — 2006-09-21T00:00:00+02:00

José Pineda de Gyvez, Guido Gronthoud, Cristiano Cenci, Martin Posch, Thomas Burger, and Manfred Koller ITC, page 980-987. IEEE, (2004)

A New Algorithm for Dynamic Faults Detection in RAMs.

dblp — 2006-01-23T00:00:00+01:00

Mohamed Azimane, Ananta K. Majhi, Guido Gronthoud, and Maurice Lousberg VTS, page 177-182. IEEE Computer Society, (2005)

Memory Testing Under Different Stress Conditions: An Industrial Evaluation.

dblp — 2005-04-13T00:00:00+02:00

Ananta K. Majhi, Mohamed Azimane, Guido Gronthoud, Maurice Lousberg, Stefan Eichenberger, and Fred Bowen DATE, page 438-443. IEEE Computer Society, (2005)

Improving Diagnostic Resolution of Delay Faults using Path Delay Fault Model.

dblp — 2004-07-06T00:00:00+02:00

Ananta K. Majhi, Guido Gronthoud, Camelia Hora, Maurice Lousberg, Pop Valer, and Stefan Eichenberger VTS, page 345-350. IEEE Computer Society, (2003)

VDD Ramp Testing for RF Circuits.

dblp — 2004-02-25T00:00:00+01:00

José Pineda de Gyvez, Guido Gronthoud, and Rashid Amine ITC, page 651-658. IEEE Computer Society, (2003)