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Applied Dynamical Systems&lt;/em&gt; &lt;em&gt;10(4):1443-1479&lt;/em&gt; (&lt;em&gt;2011&lt;/em&gt;)</content:encoded><taxo:topics><rdf:Bag><rdf:li rdf:resource="http://www.bibsonomy.org/tag/dblp"/></rdf:Bag></taxo:topics><burst:publication><rdf:Description rdf:about="http://www.bibsonomy.org/bibtex/22347b47c349f2ad477b3e811d3e9fdc2/dblp"><owl:sameAs rdf:resource="http://www.bibsonomy.org/uri/bibtex/22347b47c349f2ad477b3e811d3e9fdc2/dblp"/><rdf:type rdf:resource="http://swrc.ontoware.org/ontology#Article"/><owl:sameAs rdf:resource="http://dblp.uni-trier.de/db/journals/siamads/siamads10.html#CurtuR11"/><swrc:date>Wed Feb 08 00:00:00 CET 2012</swrc:date><swrc:journal>SIAM J. Applied Dynamical Systems</swrc:journal><swrc:number>4</swrc:number><swrc:pages>1443-1479</swrc:pages><swrc:title>Interaction of Canard and Singular Hopf Mechanisms in a Neural Model.</swrc:title><swrc:volume>10</swrc:volume><swrc:year>2011</swrc:year><swrc:keywords>dblp </swrc:keywords><swrc:hasExtraField><swrc:Field swrc:value="http://dx.doi.org/10.1137/110823171" swrc:key="ee"/></swrc:hasExtraField><swrc:author><rdf:Seq><rdf:_1><swrc:Person swrc:name="Rodica Curtu"/></rdf:_1><rdf:_2><swrc:Person swrc:name="Jonathan Rubin"/></rdf:_2></rdf:Seq></swrc:author></rdf:Description></burst:publication></item><item rdf:about="http://www.bibsonomy.org/bibtex/26376c94b25b05ebc29466d6f520e63b3/dblp"><title>Choose-your-own-adventure routing: Lightweight load-time defect avoidance.</title><link>http://www.bibsonomy.org/bibtex/26376c94b25b05ebc29466d6f520e63b3/dblp</link><dc:creator>dblp</dc:creator><dc:date>2012-02-08T00:00:00+01:00</dc:date><dc:subject>dblp </dc:subject><content:encoded>&lt;span class=&#034;authorEditorList&#034;&gt;&lt;a href=&#034;/author/Rubin&#034;&gt;Raphael Rubin&lt;/a&gt;,  and &lt;a href=&#034;/author/DeHon&#034;&gt;André DeHon&lt;/a&gt; &lt;/span&gt;&lt;em&gt;TRETS&lt;/em&gt; &lt;em&gt;4(4):33&lt;/em&gt; (&lt;em&gt;2011&lt;/em&gt;)</content:encoded><taxo:topics><rdf:Bag><rdf:li rdf:resource="http://www.bibsonomy.org/tag/dblp"/></rdf:Bag></taxo:topics><burst:publication><rdf:Description rdf:about="http://www.bibsonomy.org/bibtex/26376c94b25b05ebc29466d6f520e63b3/dblp"><owl:sameAs rdf:resource="http://www.bibsonomy.org/uri/bibtex/26376c94b25b05ebc29466d6f520e63b3/dblp"/><rdf:type rdf:resource="http://swrc.ontoware.org/ontology#Article"/><owl:sameAs rdf:resource="http://dblp.uni-trier.de/db/journals/trets/trets4.html#RubinD11"/><swrc:date>Wed Feb 08 00:00:00 CET 2012</swrc:date><swrc:journal>TRETS</swrc:journal><swrc:number>4</swrc:number><swrc:pages>33</swrc:pages><swrc:title>Choose-your-own-adventure routing: Lightweight load-time defect avoidance.</swrc:title><swrc:volume>4</swrc:volume><swrc:year>2011</swrc:year><swrc:keywords>dblp </swrc:keywords><swrc:hasExtraField><swrc:Field swrc:value="http://doi.acm.org/10.1145/2068716.2068719" swrc:key="ee"/></swrc:hasExtraField><swrc:author><rdf:Seq><rdf:_1><swrc:Person swrc:name="Raphael Rubin"/></rdf:_1><rdf:_2><swrc:Person swrc:name="André DeHon"/></rdf:_2></rdf:Seq></swrc:author></rdf:Description></burst:publication></item><item rdf:about="http://www.bibsonomy.org/bibtex/2282836f5d04c4a5455746a084a621ede/dblp"><title>A Methodology for Designing Optimal Self-Checking Sequential Circuits.</title><link>http://www.bibsonomy.org/bibtex/2282836f5d04c4a5455746a084a621ede/dblp</link><dc:creator>dblp</dc:creator><dc:date>2012-02-08T00:00:00+01:00</dc:date><dc:subject>dblp </dc:subject><content:encoded>&lt;span class=&#034;authorEditorList&#034;&gt;&lt;a href=&#034;/author/Parekhji&#034;&gt;Rubin A. 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Sherlekar&lt;/a&gt; &lt;/span&gt;&lt;em&gt;ITC, &lt;/em&gt;&lt;em&gt;page 283-291. &lt;/em&gt;&lt;em&gt;IEEE Computer Society, &lt;/em&gt;(&lt;em&gt;1991&lt;/em&gt;)</content:encoded><taxo:topics><rdf:Bag><rdf:li rdf:resource="http://www.bibsonomy.org/tag/dblp"/></rdf:Bag></taxo:topics><burst:publication><rdf:Description rdf:about="http://www.bibsonomy.org/bibtex/2282836f5d04c4a5455746a084a621ede/dblp"><owl:sameAs rdf:resource="http://www.bibsonomy.org/uri/bibtex/2282836f5d04c4a5455746a084a621ede/dblp"/><rdf:type rdf:resource="http://swrc.ontoware.org/ontology#InProceedings"/><owl:sameAs rdf:resource="http://dblp.uni-trier.de/db/conf/itc/itc1991.html#ParekhjiVS91"/><swrc:date>Wed Feb 08 00:00:00 CET 2012</swrc:date><swrc:booktitle>ITC</swrc:booktitle><swrc:crossref>conf/itc/1991</swrc:crossref><swrc:pages>283-291</swrc:pages><swrc:publisher><swrc:Organization swrc:name="IEEE Computer Society"/></swrc:publisher><swrc:title>A Methodology for Designing Optimal Self-Checking Sequential Circuits.</swrc:title><swrc:year>1991</swrc:year><swrc:keywords>dblp </swrc:keywords><swrc:hasExtraField><swrc:Field swrc:value="http://dx.doi.org/10.1109/TEST.1991.519520" swrc:key="ee"/></swrc:hasExtraField><swrc:hasExtraField><swrc:Field swrc:value="0-8186-9156-5" swrc:key="isbn"/></swrc:hasExtraField><swrc:author><rdf:Seq><rdf:_1><swrc:Person swrc:name="Rubin A. 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Parekhji&lt;/a&gt; &lt;/span&gt;&lt;em&gt;ITC, &lt;/em&gt;&lt;em&gt;page 1279. &lt;/em&gt;&lt;em&gt;IEEE Computer Society, &lt;/em&gt;(&lt;em&gt;2003&lt;/em&gt;)</content:encoded><taxo:topics><rdf:Bag><rdf:li rdf:resource="http://www.bibsonomy.org/tag/dblp"/></rdf:Bag></taxo:topics><burst:publication><rdf:Description rdf:about="http://www.bibsonomy.org/bibtex/2967fe1874a68c03a6628c0655bc65719/dblp"><owl:sameAs rdf:resource="http://www.bibsonomy.org/uri/bibtex/2967fe1874a68c03a6628c0655bc65719/dblp"/><rdf:type rdf:resource="http://swrc.ontoware.org/ontology#InProceedings"/><owl:sameAs rdf:resource="http://dblp.uni-trier.de/db/conf/itc/itc2003.html#Parekhji03"/><swrc:date>Wed Feb 08 00:00:00 CET 2012</swrc:date><swrc:booktitle>ITC</swrc:booktitle><swrc:crossref>conf/itc/2003</swrc:crossref><swrc:pages>1279</swrc:pages><swrc:publisher><swrc:Organization swrc:name="IEEE Computer Society"/></swrc:publisher><swrc:title>Panel Synopsis - How (In)Adequate is One Time Testing?</swrc:title><swrc:year>2003</swrc:year><swrc:keywords>dblp </swrc:keywords><swrc:hasExtraField><swrc:Field swrc:value="http://doi.ieeecomputersociety.org/10.1109/TEST.2003.1271119" swrc:key="ee"/></swrc:hasExtraField><swrc:hasExtraField><swrc:Field swrc:value="0-7803-8106-8" swrc:key="isbn"/></swrc:hasExtraField><swrc:author><rdf:Seq><rdf:_1><swrc:Person swrc:name="Rubin A. 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Parekhji&lt;/a&gt; &lt;/span&gt;&lt;em&gt;ITC, &lt;/em&gt;&lt;em&gt;page 417-425. &lt;/em&gt;&lt;em&gt;IEEE Computer Society, &lt;/em&gt;(&lt;em&gt;2000&lt;/em&gt;)</content:encoded><taxo:topics><rdf:Bag><rdf:li rdf:resource="http://www.bibsonomy.org/tag/dblp"/></rdf:Bag></taxo:topics><burst:publication><rdf:Description rdf:about="http://www.bibsonomy.org/bibtex/2622f465832aba2447711b33ff337af16/dblp"><owl:sameAs rdf:resource="http://www.bibsonomy.org/uri/bibtex/2622f465832aba2447711b33ff337af16/dblp"/><rdf:type rdf:resource="http://swrc.ontoware.org/ontology#InProceedings"/><owl:sameAs rdf:resource="http://dblp.uni-trier.de/db/conf/itc/itc2000.html#AbrahamPSBP00"/><swrc:date>Wed Feb 08 00:00:00 CET 2012</swrc:date><swrc:booktitle>ITC</swrc:booktitle><swrc:crossref>conf/itc/2000</swrc:crossref><swrc:pages>417-425</swrc:pages><swrc:publisher><swrc:Organization swrc:name="IEEE Computer Society"/></swrc:publisher><swrc:title>A framework to evaluate test tradeoffs in embedded core based systems-case study on TI&#039;s TMS320C27xx.</swrc:title><swrc:year>2000</swrc:year><swrc:keywords>dblp </swrc:keywords><swrc:hasExtraField><swrc:Field swrc:value="http://doi.ieeecomputersociety.org/10.1109/TEST.2000.894233" swrc:key="ee"/></swrc:hasExtraField><swrc:author><rdf:Seq><rdf:_1><swrc:Person swrc:name="Jais Abraham"/></rdf:_1><rdf:_2><swrc:Person swrc:name="Narayan Prasad"/></rdf:_2><rdf:_3><swrc:Person swrc:name="Srinivasa Chakravarthy B. 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Rubin&lt;/a&gt;, &lt;a href=&#034;/author/Chen&#034;&gt;Yimin Chen&lt;/a&gt;,  and &lt;a href=&#034;/author/Thorimbert&#034;&gt;Lynne Marie Thorimbert&lt;/a&gt; &lt;/span&gt;&lt;em&gt;Library Hi Tech&lt;/em&gt; &lt;em&gt;28(4):496-522&lt;/em&gt; (&lt;em&gt;2010&lt;/em&gt;)</content:encoded><taxo:topics><rdf:Bag><rdf:li rdf:resource="http://www.bibsonomy.org/tag/dblp"/></rdf:Bag></taxo:topics><burst:publication><rdf:Description rdf:about="http://www.bibsonomy.org/bibtex/2dc0c056857534247fbb66cb01d03597c/dblp"><owl:sameAs rdf:resource="http://www.bibsonomy.org/uri/bibtex/2dc0c056857534247fbb66cb01d03597c/dblp"/><rdf:type rdf:resource="http://swrc.ontoware.org/ontology#Article"/><owl:sameAs rdf:resource="http://dblp.uni-trier.de/db/journals/lht/lht28.html#RubinCT10"/><swrc:date>Mon Feb 06 00:00:00 CET 2012</swrc:date><swrc:journal>Library Hi Tech</swrc:journal><swrc:number>4</swrc:number><swrc:pages>496-522</swrc:pages><swrc:title>Artificially intelligent conversational agents in libraries.</swrc:title><swrc:volume>28</swrc:volume><swrc:year>2010</swrc:year><swrc:keywords>dblp </swrc:keywords><swrc:hasExtraField><swrc:Field swrc:value="http://dx.doi.org/10.1108/07378831011096196" swrc:key="ee"/></swrc:hasExtraField><swrc:author><rdf:Seq><rdf:_1><swrc:Person swrc:name="Victoria L. 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Agrawal&lt;/a&gt; &lt;/span&gt;&lt;em&gt;VTS, &lt;/em&gt;&lt;em&gt;page 285-290. &lt;/em&gt;&lt;em&gt;IEEE Computer Society, &lt;/em&gt;(&lt;em&gt;2011&lt;/em&gt;)</content:encoded><taxo:topics><rdf:Bag><rdf:li rdf:resource="http://www.bibsonomy.org/tag/dblp"/></rdf:Bag></taxo:topics><burst:publication><rdf:Description rdf:about="http://www.bibsonomy.org/bibtex/256bd2a9d30eae4101e019404fce67c11/dblp"><owl:sameAs rdf:resource="http://www.bibsonomy.org/uri/bibtex/256bd2a9d30eae4101e019404fce67c11/dblp"/><rdf:type rdf:resource="http://swrc.ontoware.org/ontology#InProceedings"/><owl:sameAs rdf:resource="http://dblp.uni-trier.de/db/conf/vts/vts2011.html#AlampallyVSPA11"/><swrc:date>Mon Feb 06 00:00:00 CET 2012</swrc:date><swrc:booktitle>VTS</swrc:booktitle><swrc:crossref>conf/vts/2011</swrc:crossref><swrc:pages>285-290</swrc:pages><swrc:publisher><swrc:Organization swrc:name="IEEE Computer Society"/></swrc:publisher><swrc:title>An efficient test data reduction technique through dynamic pattern mixing across multiple fault models.</swrc:title><swrc:year>2011</swrc:year><swrc:keywords>dblp </swrc:keywords><swrc:hasExtraField><swrc:Field swrc:value="http://dx.doi.org/10.1109/VTS.2011.5783735" swrc:key="ee"/></swrc:hasExtraField><swrc:author><rdf:Seq><rdf:_1><swrc:Person swrc:name="Srinivasulu Alampally"/></rdf:_1><rdf:_2><swrc:Person swrc:name="R. 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Parekhji&lt;/a&gt; &lt;/span&gt;&lt;em&gt;ITC, &lt;/em&gt;&lt;em&gt;page 1-10. &lt;/em&gt;&lt;em&gt;IEEE, &lt;/em&gt;(&lt;em&gt;2011&lt;/em&gt;)</content:encoded><taxo:topics><rdf:Bag><rdf:li rdf:resource="http://www.bibsonomy.org/tag/dblp"/></rdf:Bag></taxo:topics><burst:publication><rdf:Description rdf:about="http://www.bibsonomy.org/bibtex/2a43006456d2d2eae12a50274a971e98a/dblp"><owl:sameAs rdf:resource="http://www.bibsonomy.org/uri/bibtex/2a43006456d2d2eae12a50274a971e98a/dblp"/><rdf:type rdf:resource="http://swrc.ontoware.org/ontology#InProceedings"/><owl:sameAs rdf:resource="http://dblp.uni-trier.de/db/conf/itc/itc2011.html#MittalBSPNSP11"/><swrc:date>Fri Feb 03 00:00:00 CET 2012</swrc:date><swrc:booktitle>ITC</swrc:booktitle><swrc:crossref>conf/itc/2011</swrc:crossref><swrc:pages>1-10</swrc:pages><swrc:publisher><swrc:Organization swrc:name="IEEE"/></swrc:publisher><swrc:title>DFT for extremely low cost test of mixed signal SOCs with integrated RF and power management.</swrc:title><swrc:year>2011</swrc:year><swrc:keywords>dblp </swrc:keywords><swrc:hasExtraField><swrc:Field swrc:value="http://dx.doi.org/10.1109/TEST.2011.6139128" swrc:key="ee"/></swrc:hasExtraField><swrc:hasExtraField><swrc:Field swrc:value="978-1-4577-0153-5" swrc:key="isbn"/></swrc:hasExtraField><swrc:author><rdf:Seq><rdf:_1><swrc:Person swrc:name="Rajesh Mittal"/></rdf:_1><rdf:_2><swrc:Person swrc:name="Lakshmanan Balasubramanian"/></rdf:_2><rdf:_3><swrc:Person swrc:name="Adesh Sontakke"/></rdf:_3><rdf:_4><swrc:Person swrc:name="Harikrishna Parthasarathy"/></rdf:_4><rdf:_5><swrc:Person swrc:name="Prakash Narayanan"/></rdf:_5><rdf:_6><swrc:Person swrc:name="Puneet Sabbarwal"/></rdf:_6><rdf:_7><swrc:Person swrc:name="Rubin A. 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Shore&lt;/a&gt;, &lt;a href=&#034;/author/Rubin&#034;&gt;Daniel L. Rubin&lt;/a&gt;,  and &lt;a href=&#034;/author/Jr.&#034;&gt;Charles E. Kahn Jr.&lt;/a&gt; &lt;/span&gt;&lt;em&gt;J. Digital Imaging&lt;/em&gt; &lt;em&gt;25(1):50-55&lt;/em&gt; (&lt;em&gt;2012&lt;/em&gt;)</content:encoded><taxo:topics><rdf:Bag><rdf:li rdf:resource="http://www.bibsonomy.org/tag/dblp"/></rdf:Bag></taxo:topics><burst:publication><rdf:Description rdf:about="http://www.bibsonomy.org/bibtex/2dd21d39be4d59861162ccdaa4f5c059b/dblp"><owl:sameAs rdf:resource="http://www.bibsonomy.org/uri/bibtex/2dd21d39be4d59861162ccdaa4f5c059b/dblp"/><rdf:type rdf:resource="http://swrc.ontoware.org/ontology#Article"/><owl:sameAs rdf:resource="http://dblp.uni-trier.de/db/journals/jdi/jdi25.html#ShoreRK12"/><swrc:date>Wed Jan 25 00:00:00 CET 2012</swrc:date><swrc:journal>J. 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