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Disambiguation of "Bosio, Alberto"

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On the correlation between Static Noise Margin and Soft Error Rate evaluated for a 40nm SRAM cell.

, , , , , , , , , and . DFTS, page 143-148. IEEE Computer Society, (2013)

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Sara Bosio

Andreas Bosio

Vera Bosio

Alberto Moreira

Alberto Coda

 

Other publications of authors with the same name

Towards approximation during test of Integrated Circuits., , , , , and . DDECS, page 28-33. IEEE, (2017)Synthesis of Finite State Machines on Memristor Crossbars., , , , , and . DDECS, page 107-112. IEEE, (2018)Assessing the Reliability of Successive Approximate Computing Algorithms under Fault Injection., , , , and . J. Electron. Test., 35 (3): 367-381 (2019)Effect-cause intra-cell diagnosis at transistor level., , , , , , and . ISQED, page 460-467. IEEE, (2013)Multi-Objective Application-Driven Approximate Design Method., , , and . IEEE Access, (2021)Emulating the Effects of Radiation-Induced Soft-Errors for the Reliability Assessment of Neural Networks., , , , , , , and . IEEE Trans. Emerg. Top. Comput., 10 (4): 1867-1882 (2022)A Survey on Deep Learning Resilience Assessment Methodologies., , , , , and . Computer, 56 (2): 57-66 (February 2023)A Genetic-algorithm-based Approach to the Design of DCT Hardware Accelerators., , , , and . ACM J. Emerg. Technol. Comput. Syst., 18 (3): 50:1-50:25 (2022)A dynamic programming algorithm for the single-machine scheduling problem with release dates and deteriorating processing times., and . Math. Methods Oper. Res., 69 (2): 271-280 (2009)March Test Generation Revealed., , , , and . IEEE Trans. Computers, 57 (12): 1704-1713 (2008)