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On the correlation between Static Noise Margin and Soft Error Rate evaluated for a 40nm SRAM cell.

E. Vatajelu, G. Tsiligiannis, L. Dilillo, A. Bosio, P. Girard, S. Pravossoudovitch, A. Todri, A. Virazel, F. Wrobel, and F. Saigné. DFTS, page 143-148. IEEE Computer Society, (2013)

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Benoît Girard

Jules Girard

Adrien Girard

Pierre Girard

Yann Girard

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Low-energy BIST design: impact of the LFSR TPG parameters on the weighted switching activity.P. Girard, L. Guiller, C. Landrault, S. Pravossoudovitch, J. Figueras, S. Manich, J. Teixeira, and M. Santos. ISCAS (1), page 110-113. IEEE, (1999)Logical dynamics of belief change in the community.F. Liu, J. Seligman, and P. Girard. Synthese, 191 (11): 2403-2431 (2014)Effect-cause intra-cell diagnosis at transistor level.Z. Sun, A. Bosio, L. Dilillo, P. Girard, A. Todri, A. Virazel, and E. Auvray. ISQED, page 460-467. IEEE, (2013)Structural-Based Power-Aware Assignment of Don't Cares for Peak Power Reduction during Scan Testing.N. Badereddine, P. Girard, S. Pravossoudovitch, C. Landrault, A. Virazel, and H. Wunderlich. VLSI-SoC, page 403-408. IEEE, (2006)Energy Model based Control for Forming Processes.P. Girard, and V. Thomson. ICINCO-ICSO, page 51-59. INSTICC Press, (2008)Prioritised ceteris paribus logic for counterfactual reasoning.P. Girard, and M. Triplett. Synthese, 195 (4): 1681-1703 (2018)Example-based programming: a pertinent visual approach for learning to program.N. Guibert, P. Girard, and L. Guittet. AVI, page 358-361. ACM Press, (2004)Validation d'une approche " basée sur exemples " pour l'apprentissage de la programmation.N. Guibert, L. Guittet, and P. Girard. IHM, volume 264 of ACM International Conference Proceeding Series, page 147-154. ACM, (2005)Towards approximation during test of Integrated Circuits.I. Wali, M. Traiola, A. Virazel, P. Girard, M. Barbareschi, and A. Bosio. DDECS, page 28-33. IEEE, (2017)An advanced diagnostic method for delay faults in combinational faulty circuits.P. Girard, C. Landrault, and S. Pravossoudovitch. J. Electron. Test., 6 (3): 277-294 (1995)

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Disambiguation of "Girard, Patrick"

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On the correlation between Static Noise Margin and Soft Error Rate evaluated for a 40nm SRAM cell.

Please choose a person to relate this publication to

Benoît Girard

Jules Girard

Adrien Girard

Pierre Girard

Yann Girard

Other publications of authors with the same name

Disambiguation

BibSonomy

Disambiguation of "Girard, Patrick"

copydeleteadd this publication to your clipboardcommunity posthistory of this postURLDOIBibTeXEndNoteAPAChicagoDIN 1505HarvardMSOffice XML On the correlation between Static Noise Margin and Soft Error Rate evaluated for a 40nm SRAM cell.

Please choose a person to relate this publication to

Benoît Girard

Jules Girard

Adrien Girard

Pierre Girard

Yann Girard

Other publications of authors with the same name

Disambiguation

copy delete add this publication to your clipboard
community post
history of this post
URL
DOI
BibTeX
EndNote
APA
Chicago
DIN 1505
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MSOffice XML

On the correlation between Static Noise Margin and Soft Error Rate evaluated for a 40nm SRAM cell.