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In-field functional test programs development flow for embedded FPUs.

, , , , and . DFT, page 107-110. IEEE Computer Society, (2016)

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Computing for LQCD: apeNEXT., , , , , , , , , and 9 other author(s). Comput. Sci. Eng., 8 (1): 18-29 (2006)Software-Based Self-Test Techniques for Dual-Issue Embedded Processors., , , , , and . IEEE Trans. Emerg. Top. Comput., 8 (2): 464-477 (2020)Non-Intrusive Self-Test Library for Automotive Critical Applications: Constraints and Solutions., , , , , , , , and . DATE, page 920-923. IEEE, (2019)apeNEXT: a Multi-TFlops Computer for Elementary Particle Physics., , , , , , , , , and 11 other author(s). PARCO, volume 13 of Advances in Parallel Computing, page 355-362. Elsevier, (2003)Parallel software-based self-test suite for multi-core system-on-chip: Migration from single-core to multi-core automotive microcontrollers., , , , and . DTIS, page 1-6. IEEE, (2018)Development Flow for On-Line Core Self-Test of Automotive Microcontrollers., , , , and . IEEE Trans. Computers, 65 (3): 744-754 (2016)Deterministic Cache-based Execution of On-line Self-Test Routines in Multi-core Automotive System-on-Chips., , , , , , , and . DATE, page 1235-1240. IEEE, (2020)On-line software-based self-test for ECC of embedded RAM memories., , , and . DFT, page 1-6. IEEE Computer Society, (2017)Software-based self-test techniques of computational modules in dual issue embedded processors., , , , , , , and . ETS, page 1-2. IEEE, (2015)In-field functional test programs development flow for embedded FPUs., , , , and . DFT, page 107-110. IEEE Computer Society, (2016)