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ADC testing using joint time-frequency analysis., , and . Comput. Stand. Interfaces, 23 (2): 129-135 (2001)Evaluation of iDD/vOUT Cross-Correlation for Mixed Current/Voltage Testing of Analogue and Mixed-Signal Circuits., and . ED&TC, page 264-269. IEEE Computer Society, (1996)A processor for testing mixed-signal cores in System-on-Chip., , , , and . DSD, page 184-191. IEEE Computer Society, (2005)Mixed current/voltage observation towards effective testing of analog and mixed-signal circuits., , , and . J. Electron. Test., 9 (1-2): 75-88 (1996)Mixed-Signal Board Level DfT Techniques Using IEEE P1149.4., and . ICECS, page 441-446. IEEE, (1998)Implementation of Mixed Current/Voltage Testing Using the IEEE P1149.4 Infrastructure., , , and . ITC, page 509-517. IEEE Computer Society, (1997)An Approach to Testability Improvement of Mixed-Signal Boards., , , and . ISCAS, page 161-164. IEEE, (1994)Mixed-Signal BIST Using Correlation and Reconfigurable Hardware., , and . DATE, page 744. IEEE Computer Society / ACM, (2000)Architecture of test support ICs for mixed-signal testing., , , and . VTS, page 240-246. IEEE Computer Society, (1994)RobôCIn Small Size League Extended Team Description Paper for RoboCup 2023., , , , , , , , , and 15 other author(s). CoRR, (2023)