Author of the publication

ETS-A: A New Electrothermal Simulator for CMOS VLSI Circuits.

, , and . ED&TC, page 566-570. IEEE Computer Society, (1996)

Please choose a person to relate this publication to

To differ between persons with the same name, the academic degree and the title of an important publication will be displayed. You can also use the button next to the name to display some publications already assigned to the person.

 

Other publications of authors with the same name

ETS-A: A New Electrothermal Simulator for CMOS VLSI Circuits., , and . ED&TC, page 566-570. IEEE Computer Society, (1996)Application-Based, Transistor-Level Full-Chip Power Analysis for 700 MHz PowerPCTM Microprocessor., , and . ICCD, page 215-220. IEEE Computer Society, (2000)Efficient trimmed-sample Monte Carlo methodology and yield-aware design flow for analog circuits., , , , and . DAC, page 1113-1118. ACM, (2012)Temperature-driven power and timing analysis for CMOS ULSI circuits., and . ISCAS (6), page 214-217. IEEE, (1999)Hierarchical Electromigration Reliability Diagnosis for VLSI Interconnects., , , and . DAC, page 752-757. ACM Press, (1996)A New Flexible Algorithm for Random Yield Improvement., , , , , , , and . ISQED, page 795-800. IEEE Computer Society, (2007)ILLIADS-T: an electrothermal timing simulator for temperature-sensitive reliability diagnosis of CMOS VLSI chips., , , , and . IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 17 (8): 668-681 (1998)A temperature-aware simulation environment for reliable ULSI chipdesign., and . IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 19 (10): 1211-1220 (2000)Chip-Level Thermal Simulator to Predict VLSI Chip Temperature., and . ISCAS, page 1392-1395. IEEE, (1995)iCET: A Complete Chip-Level Thermal Reliability Diagnosis Tool for CMOS VLSI Chips., , , , and . DAC, page 548-551. ACM Press, (1996)