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Disambiguation of "Landrault, Christian"

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Yield Improvement, Fault-Tolerance to the Rescue?.

, , , , , and . IOLTS, page 165-166. IEEE Computer Society, (2008)

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Christian Christian

Christian Schüller

Automatisierte Feedbackgenerierung in der benutzerzentrierten Softwareentwicklung am Beispiel mobiler Anwendungen. TU München, (2009)

Christian Winter

Gold-katalysierte Cycloisomerisierung funktionalisierter Allene und Anwendung in der Naturstoffsynthese. TU Dortmund, (2009)

Christian Helbig

Synthese und Charakterisierung von metallorganischen Bronzen. Uni Augsburg, (2009)

Christian Gröling

Optimierungspotenzial bei Servoumrichtern für permanenterregte Synchronmaschinen. TU Braunschweig, (2009)
 

Other publications of authors with the same name

Effectiveness of a Variable Sampling Time Strategy for Delay Fault Diagnosis., , , and . EDAC-ETC-EUROASIC, page 518-523. IEEE Computer Society, (1994)High Defect Coverage with Low-Power Test Sequences in a BIST Environment., , , , and . IEEE Des. Test Comput., 19 (5): 44-52 (2002)Delay Fault Testing: Choosing Between Random SIC and Random MIC Test Sequences., , , , and . J. Electron. Test., 17 (3-4): 233-241 (2001)A Gated Clock Scheme for Low Power Testing of Logic Cores., , , , , and . J. Electron. Test., 22 (1): 89-99 (2006)Generalized Distributed Comparison-Based System-Level Diagnosis., , , , , and . LATW, page 285-290. IEEE, (2001)Low power BIST design by hypergraph partitioning: methodology and architectures., , , and . ITC, page 652-661. IEEE Computer Society, (2000)An adjacency-based test pattern generator for low power BIST design., , , and . Asian Test Symposium, page 459-464. IEEE Computer Society, (2000)An optimized BIST test pattern generator for delay testing., , , and . VTS, page 94-100. IEEE Computer Society, (1997)A Test Vector Inhibiting Technique for Low Energy BIST Design., , , and . VTS, page 407-412. IEEE Computer Society, (1999)A Gated Clock Scheme for Low Power Scan-Based BIST., , , , and . IOLTW, page 87-89. IEEE Computer Society, (2001)