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Improved n-Detection Test Sequences Under Transparent Scan.

, and . IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 25 (11): 2492-2501 (2006)

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Scan BIST Targeting Transition Faults Using a Markov Source., , and . ISQED, page 497-502. IEEE Computer Society, (2004)On multiple bridging faults., and . VTS, page 221-226. IEEE Computer Society, (2010)EXTEST: a method to extend test sequences of synchronous sequential circuits to increase the fault coverage., and . VTS, page 329-335. IEEE Computer Society, (1997)Testing of Non-Isolated Embedded Legacy Cores and their Surrounding Logic., and . VTS, page 41-48. IEEE Computer Society, (1999)On Synchronizing Sequences and Test Sequence Partitioning., and . VTS, page 158-167. IEEE Computer Society, (1998)On Generating Test Sets that Remain Valid in the Presence of Undetected Faults., and . Great Lakes Symposium on VLSI, page 20-25. IEEE Computer Society, (1997)PASTA: Partial Scan to Enhance Test Compaction., and . Great Lakes Symposium on VLSI, page 4-7. IEEE Computer Society, (1999)Concurrent On-Line Testing of Identical Circuits Through Output Comparison Using Non-Identical Input Vectors., and . DFT, page 469-476. IEEE Computer Society, (2004)Improving the Detectability of Resistive Open Faults in Scan Cells., , , , and . DFT, page 383-391. IEEE Computer Society, (2009)Detection of Transistor Stuck-Open Faults in Asynchronous Inputs of Scan Cells., , , , and . DFT, page 394-402. IEEE Computer Society, (2008)