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A Monolithic Hough Transform Processor Based on Restructurable VLSI.

, , , , , and . IEEE Trans. Pattern Anal. Mach. Intell., 10 (1): 106-110 (1988)

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A Monolithic Hough Transform Processor Based on Restructurable VLSI., , , , , and . IEEE Trans. Pattern Anal. Mach. Intell., 10 (1): 106-110 (1988)Statistical identification and analysis of defect development in digital imagers., , , and . Digital Photography, volume 7250 of SPIE Proceedings, page 72500. SPIE, (2009)Yield improvement of a large area magnetic field sensor array using redundancy schemes., and . IEEE Trans. Very Large Scale Integr. Syst., 5 (1): 28-33 (1997)Fault Tolerance for Islandable-Microgrid Sensors., and . DFT, page 1-4. IEEE, (2021)Correcting high-density hot pixel defects in digital imagers., , , and . IMSE, volume 9022 of SPIE Proceedings, page 90220G. SPIE, (2014)Hot Pixel Behavior as Pixel Size Reduces to 1 micron., , , and . IMSE, page 39-45. Society for Imaging Science and Technology, (2017)Empirical formula for rates of hot pixel defects based on pixel size, sensor area, and ISO., , , and . Sensors, Cameras, and Systems for Industrial and Scientific Applications, volume 8659 of SPIE Proceedings, page 86590C. SPIE, (2013)Advanced Fault-Tolerance Techniques for a Color Digital Camera-on-a-Chip., , and . DFT, page 3-10. IEEE Computer Society, (2001)Experimental study and analysis of soft and permanent errors in digital cameras., , , , and . DFT, page 11-14. IEEE Computer Society, (2016)Laser Processes for Defect Correction in Large Area VLSI Systems.. DFT, page 106-114. IEEE Computer Society, (1994)