( en | de | ru )

 

Disambiguation of "Yeo, Kiat Seng"

Author of the publication

copydeleteadd this publication to your clipboard
A 60GHz BiCMOS self-demodulator with injection locked oscillator.

, , , , , and . ISOCC, page 258-261. IEEE, (2011)

Please choose a person to relate this publication to

To differ between persons with the same name, the academic degree and the title of an important publication will be displayed. You can also use the button next to the name to display some publications already assigned to the person.

Zié Yeo

Inho Yeo

Fuangpet Kiativesi-Koanantakul

Sirichai Kiattavorncharoen

Vichit Kiatsrichart

 

Other publications of authors with the same name

A 2.1-GHz PLL with -80dBc/-74dBc reference spur based on aperture-phase detector and phase-to-analog converter., , , , , , and . A-SSCC, page 141-144. IEEE, (2011)2.5 A 2-to-6GHz Class-AB power amplifier with 28.4% PAE in 65nm CMOS supporting 256QAM., , and . ISSCC, page 1-3. IEEE, (2015)A low power millimetre-wave VCO in 0.18 µm SiGe BiCMOS technology., , , and . APCCAS, page 244-247. IEEE, (2012)SiGe BiCMOS power amplifiers for 60GHz ISM band applications., , , , and . ISOCC, page 13-16. IEEE, (2011)A charge-trapping-based technique to design low-voltage BiCMOS logic circuits., and . IEEE J. Solid State Circuits, 33 (1): 164-168 (1998)0.77 fJ/bit/search Content Addressable Memory Using Small Match Line Swing and Automated Background Checking Scheme for Variation Tolerance., , , , , and . IEEE J. Solid State Circuits, 49 (7): 1487-1498 (2014)Power-Efficient Explicit-Pulsed Dual-Edge Triggered Sense-Amplifier Flip-Flops., , , and . IEEE Trans. Very Large Scale Integr. Syst., 19 (1): 1-9 (2011)Design and Sensitivity Analysis of a New Current-Mode Sense Amplifier for Low-Power SRAM., , , and . IEEE Trans. Very Large Scale Integr. Syst., 19 (2): 196-204 (2011)A data-dependent energy reduction algorithm for SAR ADC using self-adaptive window., , , , and . Microelectron. J., (2020)A low power low phase noise dual-band multiphase VCO., , , , and . Microelectron. J., 43 (12): 1016-1022 (2012)