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A 14 nm SoC platform technology featuring 2nd generation Tri-Gate transistors, 70 nm gate pitch, 52 nm metal pitch, and 0.0499 um2 SRAM cells, optimized for low power, high performance and high density SoC products.

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A 1.1GHz 12μA/Mb-Leakage SRAM Design in 65nm Ultra-Low-Power CMOS with Integrated Leakage Reduction for Mobile Applications., , , , , , , , , and 6 other author(s). ISSCC, page 324-606. IEEE, (2007)Submicron Scaling of Indium Phosphide/indium Gallium Arsenide Heterojunction Bipolar Transistors Toward Terahertz Bandwidths. University of Illinois Urbana-Champaign, USA, (2005)E-Core Implementation in Intel 4 with PowerVia (Backside Power) Technology., , , , , , , , , and 82 other author(s). VLSI Technology and Circuits, page 1-2. IEEE, (2023)A 14 nm SoC platform technology featuring 2nd generation Tri-Gate transistors, 70 nm gate pitch, 52 nm metal pitch, and 0.0499 um2 SRAM cells, optimized for low power, high performance and high density SoC products., , , , , , , , , and 24 other author(s). VLSIC, page 12-. IEEE, (2015)A 1.1 GHz 12 µA/Mb-Leakage SRAM Design in 65 nm Ultra-Low-Power CMOS Technology With Integrated Leakage Reduction for Mobile Applications., , , , , , , , , and 7 other author(s). IEEE J. Solid State Circuits, 43 (1): 172-179 (2008)Intel 4 CMOS Technology Featuring Advanced FinFET Transistors optimized for High Density and High-Performance Computing., , , , , , , , , and 73 other author(s). VLSI Technology and Circuits, page 282-283. IEEE, (2022)Intel PowerVia Technology: Backside Power Delivery for High Density and High-Performance Computing., , , , , , , , , and 52 other author(s). VLSI Technology and Circuits, page 1-2. IEEE, (2023)