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Comparison of analytic distribution function models for hot-carrier degradation modeling in nLDMOSFETs.

P. Sharma, S. Tyaginov, Y. Wimmer, F. Rudolf, K. Rupp, H. Enichlmair, J. Park, H. Ceric, and T. Grasser. Microelectron. Reliab., 55 (9-10): 1427-1432 (2015)

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H J Plüss

H -J Bielig

J. H. Merkin

J H Mazaheri

H J Reeb

Other publications of authors with the same name

Highly Reliable and Manufacturable MRAM embedded in 14nm FinFET node.S. Ko, J. Park, J. Bak, H. Jung, J. Shim, D. Kim, W. Lim, D. Jeong, J. Lee, K. Lee and 13 other author(s). VLSI Technology and Circuits, page 1-2. IEEE, (2023)HMM Training Using Incremental Neural Network on Speech Recognition.J. Park, T. Ki, and W. Lee. ICONIP (2), page 1080-1083. Springer, (1997)Integrated Registration Based on Statistical Modeling for Medical Volume Images and its Visualization.J. Park, G. Lee, S. Kim, J. Lim, S. Park, and W. Cho. IPCV, page 632-637. CSREA Press, (2009)Threat-Based Resource Allocation Strategy for Target Tracking in a Cognitive Radar Network.J. Lee, and J. Park. CoRR, (2023)Record Transconductance in Leff~30 nm Self-Aligned Replacement Gate ETSOI nFETs Using Low EOT Negative Capacitance HfO2-ZrO2 Superlattice Gate Stack.L. Wang, W. Li, N. Shanker, S. Cheema, S. Hsu, S. Volkman, U. Sikder, C. Garg, J. Park, Y. Liao and 3 other author(s). VLSI Technology and Circuits, page 1-2. IEEE, (2023)Lifetime Modeling of the 4H-SiC MOS Interface in the HTRB Condition Under the Influence of Screw Dislocations.E. Brunt, D. Lichtenwalner, J. Park, S. Ganguly, and J. McPherson. IRPS, page 1-4. IEEE, (2023)The Implementation of Ultrasonic Hyperthermia Simulation Software.W. Yu, S. Noh, J. Park, D. Jung, and H. Choi. BMEI, page 1-3. IEEE, (2009)The transition from spinning to radial solid flame waves.J. Park, A. Bayliss, and B. Matkowsky. Appl. Math. Lett., 17 (2): 123-131 (2004)UntitledJ. Allen, C. Olson, M. Maple, J. Kang, L. Liu, J. Park, R. Anderson, W. Ellis, J. Markert, Y. Dalichaouch and 1 other author(s). Phys. Rev. Lett., (1990)Adaptive method for 2.5D scattered point approximation.S. Moon, J. Park, and K. Ko. VRST, page 46:1-46:2. ACM, (2017)

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Disambiguation of "Park, J. H."

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Comparison of analytic distribution function models for hot-carrier degradation modeling in nLDMOSFETs.

Please choose a person to relate this publication to

H J Plüss

H -J Bielig

J. H. Merkin

J H Mazaheri

H J Reeb

Other publications of authors with the same name

Disambiguation

BibSonomy

Disambiguation of "Park, J. H."

copydeleteadd this publication to your clipboardcommunity posthistory of this postURLDOIBibTeXEndNoteAPAChicagoDIN 1505HarvardMSOffice XML Comparison of analytic distribution function models for hot-carrier degradation modeling in nLDMOSFETs.

Please choose a person to relate this publication to

H J Plüss

H -J Bielig

J. H. Merkin

J H Mazaheri

H J Reeb

Other publications of authors with the same name

Disambiguation

copy delete add this publication to your clipboard
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history of this post
URL
DOI
BibTeX
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APA
Chicago
DIN 1505
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Comparison of analytic distribution function models for hot-carrier degradation modeling in nLDMOSFETs.