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iCET: A Complete Chip-Level Thermal Reliability Diagnosis Tool for CMOS VLSI Chips.

, , , , and . DAC, page 548-551. ACM Press, (1996)

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Statistical estimation of average power dissipation using nonparametric techniques., , and . IEEE Trans. Very Large Scale Integr. Syst., 6 (1): 65-73 (1998)Hierarchical Electromigration Reliability Diagnosis for VLSI Interconnects., , , and . DAC, page 752-757. ACM Press, (1996)ILLIADS-T: an electrothermal timing simulator for temperature-sensitive reliability diagnosis of CMOS VLSI chips., , , , and . IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 17 (8): 668-681 (1998)Statistical Estimation of Average Power Dissipation in Sequential Circuits., , and . DAC, page 377-382. ACM Press, (1997)Automated learning for reducing the configuration of a feedforward neural network., and . IEEE Trans. Neural Networks, 7 (5): 1072-1085 (1996)FFTPL: An analytic placement algorithm using fast fourier transform for density equalization., , , , , , and . ASICON, page 1-4. IEEE, (2013)A Study of Cache Hashing Functions for Symbolic Applications in Micro-Parallel Processors., , and . ICPADS, page 530-537. IEEE Computer Society, (1994)On convergence of switching windows computation in presence of crosstalk noise., , , and . ISPD, page 84-89. ACM, (2002)Statistical estimation of average power dissipation in CMOS VLSI circuits using nonparametric techniques., , and . ISLPED, page 73-78. IEEE, (1996)Estimation of maximum transition counts at internal nodes in CMOS VLSI circuits., , and . ICCAD, page 366-370. IEEE Computer Society / ACM, (1995)