Author of the publication

Slow write driver faults in 65nm SRAM technology: analysis and March test solution.

, , , , , and . DATE, page 528-533. EDA Consortium, San Jose, CA, USA, (2007)

Please choose a person to relate this publication to

To differ between persons with the same name, the academic degree and the title of an important publication will be displayed. You can also use the button next to the name to display some publications already assigned to the person.

 

Other publications of authors with the same name

March Pre: an Efficient Test for Resistive-Open Defects in the SRAM Pre-charge Circuit., , , , and . DDECS, page 256-261. IEEE Computer Society, (2006)A Novel Dummy Bitline Driver for Read Margin Improvement in an eSRAM., , , and . DELTA, page 107-110. IEEE Computer Society, (2008)Statistical Sizing of an eSRAM Dummy Bitline Driver for Read Margin Improvement in the Presence of Variability Aspects., , , and . ISVLSI, page 310-315. IEEE Computer Society, (2008)A Design-for-Diagnosis Technique for SRAM Write Drivers., , , , , and . DATE, page 1480-1485. ACM, (2008)A new design-for-test technique for SRAM core-cell stability faults., , , , , , and . DATE, page 1344-1348. IEEE, (2009)Slow write driver faults in 65nm SRAM technology: analysis and March test solution., , , , , and . DATE, page 528-533. EDA Consortium, San Jose, CA, USA, (2007)Dynamic Two-Cell Incorrect Read Fault Due to Resistive-Open Defects in the Sense Amplifiers of SRAMs., , , , , and . European Test Symposium, page 97-104. IEEE Computer Society, (2007)Analysis of Resistive-Open Defects in SRAM Sense Amplifiers., , , , and . IEEE Trans. Very Large Scale Integr. Syst., 17 (10): 1556-1559 (2009)Analysis and Test of Resistive-Open Defects in SRAM Pre-Charge Circuits., , , , and . J. Electron. Test., 23 (5): 435-444 (2007)Un-Restored Destructive Write Faults Due to Resistive-Open Defects in the Write Driver of SRAMs., , , , , and . VTS, page 361-368. IEEE Computer Society, (2007)