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Embedded Test for Low Cost Manufacturing., , , and . VLSI Design, page 21-23. IEEE Computer Society, (2004)ATPG Heuristics Dependant Observation Point Insertion for Enhanced Compaction and Data Volume Reduction., , , , and . DFT, page 385-393. IEEE Computer Society, (2008)Logic BIST Using Constrained Scan Cells., , , and . VTS, page 199-205. IEEE Computer Society, (2004)Hardware Ef.cient LBISTWith Complementary Weights., , , and . ICCD, page 479-484. IEEE Computer Society, (2005)High-Frequency, At-Speed Scan Testing., , , , , , and . IEEE Des. Test Comput., 20 (5): 17-25 (2003)Signature Based Diagnosis for Logic BIST., , , , and . ITC, page 1-9. IEEE Computer Society, (2006)Logic BIST with Scan Chain Segmentation., , , and . ITC, page 57-66. IEEE Computer Society, (2004)Programmable Scan-Based Logic Built-In Self Test., , and . ATS, page 371-377. IEEE, (2007)On the Generation of Compact Deterministic Test Sets for BIST Ready Designs., , , and . Asian Test Symposium, page 201-206. IEEE Computer Society, (2013)Leasing von Mobilien. Schriftenreihe zum Konsumentenschutzrecht Schulthess, Zürich, (1984)