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Disambiguation of "Stratigopoulos, Haralampos-G. D."

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Yield Forecasting in Fab-to-Fab Production Migration Based on Bayesian Model Fusion.

, , , , , and . ICCAD, page 9-14. IEEE, (2015)

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Haralampos Kouris

Haralampos Kiriakidis

Haralampos Papadopoulos

Haralampos Gousis

Haralampos Theodoros Gouveris

 

Other publications of authors with the same name

Diagnosis of Local Spot Defects in Analog Circuits., , , , , and . IEEE Trans. Instrumentation and Measurement, 61 (10): 2701-2712 (2012)Evaluation of low-cost mixed-signal test techniques for circuits with long simulation times., , , , , and . ITC, page 1-7. IEEE, (2015)Spiking Neuron Hardware-Level Fault Modeling., , , , , , and . IOLTS, page 1-4. IEEE, (2020)One-Shot Non-Intrusive Calibration Against Process Variations for Analog/RF Circuits., , and . IEEE Trans. Circuits Syst. I Regul. Pap., 63-I (11): 2022-2035 (2016)Adaptive Alternate Analog Test., and . IEEE Des. Test Comput., 29 (4): 71-79 (2012)An Analog Checker with Input-Relative Tolerance for Duplicate Signals., and . J. Electron. Test., 20 (5): 479-488 (2004)Concurrent detection of erroneous responses in linear analog circuits., and . IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 25 (5): 878-891 (2006)Review of temperature sensors as monitors for RF-MMW built-in testing and self-calibration schemes., , , , , , , , , and 7 other author(s). MWSCAS, page 1081-1084. IEEE, (2014)Fast deployment of alternate analog test using Bayesian model fusion., , , , , and . DATE, page 1030-1035. ACM, (2015)Concurrent Error Detection in Linear Analog Circuits Using State Estimation., and . ITC, page 1164-1173. IEEE Computer Society, (2003)