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Evaluating the accuracy of SRAM margin simulation through large scale Monte-Carlo simulations with accurate compact models.

P. Asenov, D. New, D. Reid, C. Millar, S. Roy, and A. Asenov. ICICDT, page 29-32. IEEE, (2013)

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Colin Davenport

Genomic and metagenomic application of microbial genome signaturesC. Davenport. MedH Hannover, (2009)

Albert Reid

Duncan Reid

Anand Dave

Dave Toney

Other publications of authors with the same name

Enabling Cutting-Edge Semiconductor Simulation through Grid Technology.A. Asenov, D. Reid, C. Millar, S. Roy, G. Roy, R. Sinnott, G. Stewart, and G. Stewart. LSSC, volume 5910 of Lecture Notes in Computer Science, page 369-378. Springer, (2009)The evolution of standard cell libraries for future technology nodes.J. Walker, J. Hilder, D. Reid, A. Asenov, S. Roy, C. Millar, and A. Tyrrell. Genet. Program. Evolvable Mach., 12 (3): 235-256 (2011)Speed-Up of Scalable Iterative Linear Solvers Implemented on an Array of Transputers.A. Asenov, D. Reid, and J. Barker. Parallel Comput., 21 (4): 669-682 (1995)Unified approach for simulation of statistical reliability in nanoscale CMOS transistors from devices to circuits.A. Asenov, J. Ding, D. Reid, P. Asenov, S. Amoroso, F. Adamu-Lema, and L. Gerrer. ISCAS, page 2449-2452. IEEE, (2015)Speed-Up of Scalable Iterative Linear Solvers Implemented on an Array of Transputers.A. Asenov, D. Reid, and J. Barker. Parallel Comput., 20 (3): 375-387 (1994)Modelling circuit performance variations due to statistical variability: Monte Carlo static timing analysis.M. Merrett, P. Asenov, Y. Wang, M. Zwolinski, D. Reid, C. Millar, S. Roy, Z. Liu, S. Furber, and A. Asenov. DATE, page 1537-1540. IEEE, (2011)Investigation of SRAM using BTI-aware statistical compact models.J. Ding, D. Reid, C. Millar, and A. Asenov. ESSDERC, page 186-189. IEEE, (2013)Statistical simulation of random dopant induced threshold voltage fluctuations for 35 nm channel length MOSFET.U. Kovac, D. Reid, C. Millar, G. Roy, S. Roy, and A. Asenov. Microelectron. Reliab., 48 (8-9): 1572-1575 (2008)Modelling RTN and BTI in nanoscale MOSFETs from device to circuit: A review.L. Gerrer, J. Ding, S. Amoroso, F. Adamu-Lema, R. Hussin, D. Reid, C. Millar, and A. Asenov. Microelectron. Reliab., 54 (4): 682-697 (2014)An advanced statistical compact model strategy for SRAM simulation at reduced VDD.P. Asenov, D. Reid, S. Roy, C. Millar, and A. Asenov. ESSDERC, page 205-208. IEEE, (2012)

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Disambiguation of "Reid, Dave"

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Evaluating the accuracy of SRAM margin simulation through large scale Monte-Carlo simulations with accurate compact models.

Please choose a person to relate this publication to

Colin Davenport

Albert Reid

Duncan Reid

Anand Dave

Dave Toney

Other publications of authors with the same name

Disambiguation

BibSonomy

Disambiguation of "Reid, Dave"

copydeleteadd this publication to your clipboardcommunity posthistory of this postURLDOIBibTeXEndNoteAPAChicagoDIN 1505HarvardMSOffice XML Evaluating the accuracy of SRAM margin simulation through large scale Monte-Carlo simulations with accurate compact models.

Please choose a person to relate this publication to

Colin Davenport

Albert Reid

Duncan Reid

Anand Dave

Dave Toney

Other publications of authors with the same name

Disambiguation

copy delete add this publication to your clipboard
community post
history of this post
URL
DOI
BibTeX
EndNote
APA
Chicago
DIN 1505
Harvard
MSOffice XML

Evaluating the accuracy of SRAM margin simulation through large scale Monte-Carlo simulations with accurate compact models.