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SECCS: SECure Context Saving for IoT Devices., , , , , and . CoRR, (2019)Holding Conferences Online due to COVID-19: The DATE Experience., and . IEEE Des. Test, 37 (3): 116-118 (2020)PUF Enrollment and Life Cycle Management: Solutions and Perspectives for the Test Community., , , , , , , and . ETS, page 1-10. IEEE, (2020)Nonlinear Codes for Control Flow Checking., and . ETS, page 1-6. IEEE, (2020)A New Recovery Scheme Against Short-to-Long Duration Transient Faults in Combinational Logic., , , , and . J. Electron. Test., 29 (3): 331-340 (2013)Helper Data Masking for Physically Unclonable Function-Based Key Generation Algorithms., , , , , , and . IEEE Access, (2022)Programmable built-in self-testing of embedded RAM clusters in system-on-chip architectures., , , , and . IEEE Commun. Mag., 41 (9): 90-97 (2003)Introduction to the Special Issue on CAD for Security: Pre-silicon Security Sign-off Solutions Through Design Cycle., , , and . ACM J. Emerg. Technol. Comput. Syst., 19 (1): 4:1-4:4 (January 2023)March Test Generation Revealed., , , , and . IEEE Trans. Computers, 57 (12): 1704-1713 (2008)Cross-layer reliability evaluation, moving from the hardware architecture to the system level: A CLERECO EU project overview., , , , , , , , , and 1 other author(s). Microprocess. Microsystems, 39 (8): 1204-1214 (2015)