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FPGA-Based Embedded Tester with a P1687 Command, Control, and Observe-System.

, , , and . IEEE Des. Test, 30 (5): 6-14 (2013)

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Test Development for Second-Generation ColdFire Microprocessors., , , , and . IEEE Des. Test Comput., 15 (3): 70-76 (1998)Processing High Volume Scan Test Results for Yield Learning., , and . ISQED, page 293-298. IEEE Computer Society, (2007)BA-BIST: Board test from inside the IC out., and . ITC, page 1. IEEE Computer Society, (2013)Board assisted-BIST: Long and short term solutions for testpoint erosion - Reaching into the DFx toolbox., , , , , and . ITC, page 1-10. IEEE Computer Society, (2012)Optimization trade-offs for vector volume and test power., and . ITC, page 873-881. IEEE Computer Society, (2000)Detecting a trojan die in 3D stacked integrated circuits., , , , , and . NATW, page 1-6. IEEE, (2017)Test Development for a Third-Version ColdFire Microprocessor., , , , and . IEEE Des. Test Comput., 17 (4): 29-37 (2000)A Production IR-Drop Screen on a Chip., , , and . IEEE Des. Test Comput., 24 (3): 216-224 (2007)Separating temperature effects from ring-oscillator readings to measure true IR-drop on a chip., , , , , and . ITC, page 1-10. IEEE Computer Society, (2007)Future Trends in Test: The Adoption and Use of Low Cost Structural Testers.. ITC, page 698-703. IEEE Computer Society, (2004)