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Run-time reconfigurable instruments for advanced board-level testing., , and . IEEE Instrum. Meas. Mag., 20 (4): 23-30 (2017)Collaborative Distributed Computing in the Field of Digital Electronics Testing., , and . BASYS, volume 322 of IFIP Advances in Information and Communication Technology, page 145-152. Springer, (2010)On coverage of timing related faults at board level., , and . ETS, page 1-2. IEEE, (2016)Asynchronous Fault Detection in IEEE P1687 Instrument Network., , and . NATW, page 73-78. IEEE, (2014)Distributed Fault Simulation with Collaborative Load Balancing for VLSI Circuits., , and . Scalable Comput. Pract. Exp., (2011)Marginal PCB assembly defect detection on DDR3/4 memory bus., , and . ITC, page 1-10. IEEE, (2017)Ultra Fast Parallel Fault Analysis on Structurally Synthesized BDDs., , , and . ETS, page 131-136. IEEE Computer Society, (2007)Parallel Critical Path Tracing Fault Simulation in Sequential Circuits., , , , and . MIXDES, page 305-310. IEEE, (2018)Effective Scalable IEEE 1687 Instrumentation Network for Fault Management., , and . IEEE Des. Test, 30 (5): 26-35 (2013)Functional self-test of high-performance pipe-lined signal processing architectures., , , , , and . Microprocess. Microsystems, 39 (8): 909-918 (2015)